Generates a test signal on an AnalogOut and monitors a signal on an AnalogIn, plotting the test signal or the actual signal depending on a conditional compile. The wait() and wait_ms() library calls for this board are highly inaccurate so a new function is provided to wait for X number of milliseconds -- which is not very accurate.

Dependencies:   LCD_DISCO_F429ZI mbed TS_DISCO_F429ZI mbed-os BSP_DISCO_F429ZI

Revision:
2:cbcf2695a4a1
diff -r b9d4b9b8884c -r cbcf2695a4a1 LaserMon-TEC.h
--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/LaserMon-TEC.h	Mon Jun 17 17:11:07 2019 +0000
@@ -0,0 +1,26 @@
+
+// ----------------------------------------------------------------------
+// LaserMon-TEC.h
+//
+// Fredric L. Rice, June 2019
+//
+// ----------------------------------------------------------------------
+
+// ----------------------------------------------------------------------
+// Defined constants and MACROs we may use
+//
+// ----------------------------------------------------------------------
+
+#define TEC_HISTORY_COUNT_MAX       10
+
+// ----------------------------------------------------------------------
+// External function prototype that we will export
+// 
+// ----------------------------------------------------------------------
+
+extern void     TECInit(void);
+extern void     TECThread(void);
+extern uint16_t TECGetLastTenAverage(void);
+
+// End of file
+