Generates a test signal on an AnalogOut and monitors a signal on an AnalogIn, plotting the test signal or the actual signal depending on a conditional compile. The wait() and wait_ms() library calls for this board are highly inaccurate so a new function is provided to wait for X number of milliseconds -- which is not very accurate.
Dependencies: LCD_DISCO_F429ZI mbed TS_DISCO_F429ZI mbed-os BSP_DISCO_F429ZI
Diff: LaserMon-TEC.h
- Revision:
- 2:cbcf2695a4a1
diff -r b9d4b9b8884c -r cbcf2695a4a1 LaserMon-TEC.h --- /dev/null Thu Jan 01 00:00:00 1970 +0000 +++ b/LaserMon-TEC.h Mon Jun 17 17:11:07 2019 +0000 @@ -0,0 +1,26 @@ + +// ---------------------------------------------------------------------- +// LaserMon-TEC.h +// +// Fredric L. Rice, June 2019 +// +// ---------------------------------------------------------------------- + +// ---------------------------------------------------------------------- +// Defined constants and MACROs we may use +// +// ---------------------------------------------------------------------- + +#define TEC_HISTORY_COUNT_MAX 10 + +// ---------------------------------------------------------------------- +// External function prototype that we will export +// +// ---------------------------------------------------------------------- + +extern void TECInit(void); +extern void TECThread(void); +extern uint16_t TECGetLastTenAverage(void); + +// End of file +