Generates a test signal on an AnalogOut and monitors a signal on an AnalogIn, plotting the test signal or the actual signal depending on a conditional compile. The wait() and wait_ms() library calls for this board are highly inaccurate so a new function is provided to wait for X number of milliseconds -- which is not very accurate.
Dependencies: LCD_DISCO_F429ZI mbed TS_DISCO_F429ZI mbed-os BSP_DISCO_F429ZI
LaserMon-TEC.h
- Committer:
- Damotclese
- Date:
- 2019-06-17
- Revision:
- 2:cbcf2695a4a1
File content as of revision 2:cbcf2695a4a1:
// ---------------------------------------------------------------------- // LaserMon-TEC.h // // Fredric L. Rice, June 2019 // // ---------------------------------------------------------------------- // ---------------------------------------------------------------------- // Defined constants and MACROs we may use // // ---------------------------------------------------------------------- #define TEC_HISTORY_COUNT_MAX 10 // ---------------------------------------------------------------------- // External function prototype that we will export // // ---------------------------------------------------------------------- extern void TECInit(void); extern void TECThread(void); extern uint16_t TECGetLastTenAverage(void); // End of file