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sleep hal tests
[sleep hal requirements]
The sleep HAL tests ensure driver conformance to defined behaviour. More...
Functions | |
| void | sleep_usticker_test () |
| High frequency ticker interrupt can wake up from sleep (locked deep-sleep). | |
| void | deepsleep_lpticker_test () |
| Low power ticker interrupt to wake up from deep-sleep (unlocked deep-sleep). | |
| void | deepsleep_high_speed_clocks_turned_off_test () |
| High speed clocks are turned off in deep-sleep (unlocked deep-sleep) | |
Detailed Description
The sleep HAL tests ensure driver conformance to defined behaviour.
To run the sleep hal tests use the command:
mbed test -t <toolchain> -m <target> -n tests-mbed_hal-sleep*
Function Documentation
| void deepsleep_high_speed_clocks_turned_off_test | ( | ) |
High speed clocks are turned off in deep-sleep (unlocked deep-sleep)
Given is an environment with high frequency ticker. When the board enters deep-sleep mode. Then high frequency ticker does not count while the board is in the deep-sleep mode.
Definition at line 222 of file mbed-os/TESTS/mbed_hal/sleep/main.cpp.
| void deepsleep_lpticker_test | ( | ) |
Low power ticker interrupt to wake up from deep-sleep (unlocked deep-sleep).
Given is an environment with low power ticker. When the board enters deep-sleep mode. Then the board can be wake up from the sleep by low power ticker interrupt and wake-up time should be less than 10 ms.
Definition at line 184 of file mbed-os/TESTS/mbed_hal/sleep/main.cpp.
| void sleep_usticker_test | ( | ) |
High frequency ticker interrupt can wake up from sleep (locked deep-sleep).
Given is an environment with high frequency ticker. When the board enters sleep mode. Then the board can be wake up from the sleep by high frequency ticker interrupt and wake-up time should be less than 10 us.
Definition at line 137 of file mbed-os/TESTS/mbed_hal/sleep/main.cpp.
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