test

Fork of nRF51822 by Nordic Semiconductor

Embed: (wiki syntax)

« Back to documentation index

ble_gap_scan_params_t Struct Reference

ble_gap_scan_params_t Struct Reference
[Structures]

GAP scanning parameters. More...

#include <ble_gap.h>

Data Fields

uint8_t active: 1
 If 1, perform active scanning (scan requests).
uint8_t selective: 1
 If 1, ignore unknown devices (non whitelisted).
ble_gap_whitelist_tp_whitelist
 Pointer to whitelist, NULL if no whitelist or the current active whitelist is to be used.
uint16_t interval
 Scan interval between 0x0004 and 0x4000 in 0.625ms units (2.5ms to 10.24s).
uint16_t window
 Scan window between 0x0004 and 0x4000 in 0.625ms units (2.5ms to 10.24s).
uint16_t timeout
 Scan timeout between 0x0001 and 0xFFFF in seconds, 0x0000 disables timeout.

Detailed Description

GAP scanning parameters.

Definition at line 487 of file ble_gap.h.


Field Documentation

uint8_t active

If 1, perform active scanning (scan requests).

Definition at line 489 of file ble_gap.h.

uint16_t interval

Scan interval between 0x0004 and 0x4000 in 0.625ms units (2.5ms to 10.24s).

Definition at line 492 of file ble_gap.h.

Pointer to whitelist, NULL if no whitelist or the current active whitelist is to be used.

Definition at line 491 of file ble_gap.h.

uint8_t selective

If 1, ignore unknown devices (non whitelisted).

Definition at line 490 of file ble_gap.h.

uint16_t timeout

Scan timeout between 0x0001 and 0xFFFF in seconds, 0x0000 disables timeout.

Definition at line 494 of file ble_gap.h.

uint16_t window

Scan window between 0x0004 and 0x4000 in 0.625ms units (2.5ms to 10.24s).

Definition at line 493 of file ble_gap.h.