Generates a test signal on an AnalogOut and monitors a signal on an AnalogIn, plotting the test signal or the actual signal depending on a conditional compile. The wait() and wait_ms() library calls for this board are highly inaccurate so a new function is provided to wait for X number of milliseconds -- which is not very accurate.
Dependencies: LCD_DISCO_F429ZI mbed TS_DISCO_F429ZI mbed-os BSP_DISCO_F429ZI
Diff: LaserMon-TestOutput.h
- Revision:
- 0:1ebe7d222470
- Child:
- 1:b9d4b9b8884c
diff -r 000000000000 -r 1ebe7d222470 LaserMon-TestOutput.h --- /dev/null Thu Jan 01 00:00:00 1970 +0000 +++ b/LaserMon-TestOutput.h Mon Jun 10 17:10:01 2019 +0000 @@ -0,0 +1,24 @@ + +// ---------------------------------------------------------------------- +// LaserMon-TestOutput.h +// +// Fredric L. Rice, June 2019 +// +// ---------------------------------------------------------------------- + +// ---------------------------------------------------------------------- +// Data which this module will export globally +// +// ---------------------------------------------------------------------- + +extern float f_rampVoltage; + +// ---------------------------------------------------------------------- +// External function prototype that we will export +// +// ---------------------------------------------------------------------- + +extern void TestOutputInit(void); + +// End of file +