Maxim Integrated / MAX11410

MAX11410 high speed 24-bit Delta-Sigma ADC

Dependents:   MAX11410BOB_24bit_ADC MAX11410BOB_Serial_Tester

Diff: MAX11410.cpp

Revision:
19:50cf5da53d36
Parent:
17:0e9f2dfc2a30
Child:
20:fb7527415308
--- a/MAX11410.cpp	Tue Mar 17 02:52:04 2020 +0000
+++ b/MAX11410.cpp	Sun Mar 29 11:09:11 2020 +0000
@@ -406,6 +406,57 @@
 //----------------------------------------
 // Menu item '!'
 // Initialize device
+//
+// TODO1: #169 MAX11410 Self Test for Test Fixture Firmware
+// @test Init() expect 1
+//
+// @future test xxxxxx // comment
+//
+// TODO1: #169 SelfTest support @test tinyTester.print("message")
+// @test tinyTester.print("message print to console")
+//
+// TODO1: #169 SelfTest support RegRead
+// @test tinyTester.print("check part ID register")
+// @future test RegRead(MAX11410::CMD_enum_t::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, &buffer) expect 1 expect-buffer 0x000F02
+// @future test *CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID? expect 0x000F02
+//
+// TODO1: #169 SelfTest support RegWrite and custom enum types
+// @test tinyTester.print("check filter register POR value")
+// @future test RegRead(MAX11410::CMD_enum_t::CMD_r000_1000_x0dd_dddd_FILTER, &buffer) expect 1 expect-buffer 0x00
+// @test tinyTester.print("check filter register is writeable")
+// @future test tinyTester.print("this is a real mess dealing with the custom types")
+// @test RegWrite(0x08, 0x34) expect 1
+// @future test tinyTester.print("error: no matching function for call to 'MaximTinyTester::FunctionCall_Expect(const char [18], uint8_t (&)(MAX11410::CMD_enum_t, uint32_t), MAX11410::CMD_enum_t, uint32_t, int)'")
+// @future test RegWrite(CMD_r000_1000_x0dd_dddd_FILTER, 0x34) expect 1
+// @future test RegWrite(CMD_enum_t::CMD_r000_1000_x0dd_dddd_FILTER, 0x34) expect 1
+// @future test RegWrite(MAX11410::CMD_enum_t::CMD_r000_1000_x0dd_dddd_FILTER, 0x34) expect 1
+//
+// TODO1: #169 SelfTest support RegRead
+// @test tinyTester.print("check filter register is readable")
+// @test RegRead(0x08, buffer) expect 1 expect-buffer 0x34
+// @future test RegRead(MAX11410::CMD_enum_t::CMD_r000_1000_x0dd_dddd_FILTER, &buffer) expect 1 expect-buffer 0x34
+//
+// TODO1: #169 SelfTest support @test tinyTester.settle_time_msec = 250
+// @test tinyTester.settle_time_msec = 250 // default 250
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
+// @test tinyTester.input_timeout_time_msec = 250 // default 250
+// @test tinyTester.settle_time_msec = 20 // default 250
+// @test tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test tinyTester.input_timeout_time_msec = 100 // default 250
+//
+// TODO1: #169 SelfTest support @test tinyTester.Wait_Output_Settling()
+// @test tinyTester.Wait_Output_Settling()
+//
+// TODO1: #169 SelfTest support tinyTester.AnalogIn0_Read_Expect_voltageV(2.048)
+// @future test tinyTester.err_threshold = 0.030 // 30mV
+// @future test tinyTester.AnalogIn0_Read_Expect_voltageV(2.048)
+//
+// TODO1: #169 SelfTest support tinyTester.DigitalIn_Read_Expect_WarnOnly
+// @future test tinyTester.DigitalIn_Read_Expect_WarnOnly(DigitalIn& digitalInPin, const char* pinName, int expect_result, const char *expect_description)
+//
+// TODO1: #169 SelfTest support tinyTester.max541.Set_Code
+// @future test tinyTester.max541.Set_Code(0x8000)
+//
 // @return 1 on success; 0 on failure
 uint8_t MAX11410::Init(void)
 {
@@ -474,22 +525,24 @@
 // @param[in] value_u24: raw 24-bit MAX11410 code (right justified).
 // @return physical voltage corresponding to MAX11410 code.
 //
-// @test Configure_CTRL_REF(2) expect 1 These tests require REF2 = 2.500V
-// @test Configure_PGA(0,0) expect 1 These tests require PGA gain=1
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0xFFFFFF) expect 2.500 within 0.030 Full Scale
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0xFFFFFE) expect 2.500             Full Scale
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0xCCCCCC) expect 2.000             Two Volts
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0xC00000) expect 1.875             75% Scale
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x800000) expect 1.250             Mid Scale
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x666666) expect 1.000             One Volt
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x400000) expect 0.625             25% Scale
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x0A3D70) expect 0.100             100mV
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000064) expect 0.000014901162    100 LSB
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x00000A) expect 0.0000014901162   Ten LSB
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000003) expect 0.00000044703483  Three LSB
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000002) expect 0.00000029802326  Two LSB
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000001) expect 0.00000014901162  One LSB
-// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000000) expect 0.0               Zero Scale
+// @test tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test Configure_CTRL_REF(2) expect 1 // These tests require REF2 = 2.500V
+// @test Configure_PGA(0,0) expect 1 // These tests require PGA gain=1
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0xFFFFFF) expect 2.500 within 0.030 // Full Scale
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0xFFFFFE) expect 2.500              // Full Scale
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0xCCCCCC) expect 2.000              // Two Volts
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0xC00000) expect 1.875              // 75% Scale
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x800000) expect 1.250              // Mid Scale
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x666666) expect 1.000              // One Volt
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x400000) expect 0.625              // 25% Scale
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x0A3D70) expect 0.100              // 100mV
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000064) expect 0.000014901162     // 100 LSB
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x00000A) expect 0.0000014901162    // Ten LSB
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000003) expect 0.00000044703483   // Three LSB
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000002) expect 0.00000029802326   // Two LSB
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000001) expect 0.00000014901162   // One LSB
+// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000000) expect 0.0                // Zero Scale
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
 //
 double MAX11410::VoltageOfCode_Unipolar(uint32_t value_u24)
 {
@@ -529,21 +582,23 @@
 // @param[in] value_u24: raw 24-bit MAX11410 code (right justified).
 // @return physical voltage corresponding to MAX11410 code.
 //
-// @test Configure_CTRL_REF(2) expect 1 These tests require REF2 = 2.500V
-// @test Configure_PGA(0,0) expect 1 These tests require PGA gain=1
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xFFFFFF) expect 2.5 within 0.030  Full Scale
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xFFFFFE) expect 2.5               Full Scale
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xC00000) expect 1.25              Mid Scale
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800003) expect 0.00000894069671  Three LSB
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800002) expect 0.00000596046447  Two LSB
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800001) expect 0.0000029802326   One LSB
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800000) expect 0.0               Zero Scale
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFF) expect -0.0000029802326  Negative One LSB
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFE) expect -0.0000059604644  Negative Two LSB
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFD) expect -0.0000089406967  Negative Three LSB
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x400000) expect -1.25             Negative Mid Scale
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x000001) expect -2.5              Negative Full Scale
-// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x000000) expect -2.5              Negative Full Scale
+// @test tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test Configure_CTRL_REF(2) expect 1 // These tests require REF2 = 2.500V
+// @test Configure_PGA(0,0) expect 1 // These tests require PGA gain=1
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xFFFFFF) expect 2.5 within 0.030  // Full Scale
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xFFFFFE) expect 2.5               // Full Scale
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xC00000) expect 1.25              // Mid Scale
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800003) expect 0.00000894069671  // Three LSB
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800002) expect 0.00000596046447  // Two LSB
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800001) expect 0.0000029802326   // One LSB
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800000) expect 0.0               // Zero Scale
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFF) expect -0.0000029802326  // Negative One LSB
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFE) expect -0.0000059604644  // Negative Two LSB
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFD) expect -0.0000089406967  // Negative Three LSB
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x400000) expect -1.25             // Negative Mid Scale
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x000001) expect -2.5              // Negative Full Scale
+// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x000000) expect -2.5              // Negative Full Scale
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
 //
 double MAX11410::VoltageOfCode_Bipolar_OffsetBinary(uint32_t value_u24)
 {
@@ -584,31 +639,33 @@
 // @param[in] value_u24: raw 24-bit MAX11410 code (right justified).
 // @return physical voltage corresponding to MAX11410 code.
 //
-// @test Configure_CTRL_REF(2) expect 1 These tests require REF2 = 2.500V
-// @test Configure_PGA(0,0) expect 1 These tests require PGA gain=1
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x7FFFFF) expect 2.500 within 0.030 Full Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x7FFFFE) expect 2.500             Full Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x666666) expect 2.000             Two Volts
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x600000) expect 1.875             75% Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x400000) expect 1.250             Mid Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x333333) expect 1.000             One Volt
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x200000) expect 0.625             25% Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x051eb8) expect 0.100             100mV
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000003) expect 0.00000894069671  Three LSB
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000002) expect 0.00000596046447  Two LSB
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000001) expect 0.0000029802326   One LSB
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000000) expect 0.0               Zero Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFF) expect -0.0000029802326  Negative One LSB
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFE) expect -0.0000059604644  Negative Two LSB
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFD) expect -0.0000089406967  Negative Three LSB
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFAE148) expect -0.100            Negative 100mV
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xE00000) expect -0.625            Negative 25% Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xCCCCCD) expect -1.000            Negative One Volt
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xC00000) expect -1.250            Negative Mid Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xA00000) expect -1.875            Negative 75% Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x99999A) expect -2.000            Negative Two Volts
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x800001) expect -2.500            Negative Full Scale
-// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x800000) expect -2.500            Negative Full Scale
+// @test tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test Configure_CTRL_REF(2) expect 1 // These tests require REF2 = 2.500V
+// @test Configure_PGA(0,0) expect 1 // These tests require PGA gain=1
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x7FFFFF) expect 2.500 within 0.030 // Full Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x7FFFFE) expect 2.500              // Full Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x666666) expect 2.000              // Two Volts
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x600000) expect 1.875              // 75% Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x400000) expect 1.250              // Mid Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x333333) expect 1.000              // One Volt
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x200000) expect 0.625              // 25% Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x051eb8) expect 0.100              // 100mV
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000003) expect 0.00000894069671   // Three LSB
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000002) expect 0.00000596046447   // Two LSB
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000001) expect 0.0000029802326    // One LSB
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000000) expect 0.0                // Zero Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFF) expect -0.0000029802326   // Negative One LSB
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFE) expect -0.0000059604644   // Negative Two LSB
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFD) expect -0.0000089406967   // Negative Three LSB
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFAE148) expect -0.100             // Negative 100mV
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xE00000) expect -0.625             // Negative 25% Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xCCCCCD) expect -1.000             // Negative One Volt
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xC00000) expect -1.250             // Negative Mid Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xA00000) expect -1.875             // Negative 75% Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x99999A) expect -2.000             // Negative Two Volts
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x800001) expect -2.500             // Negative Full Scale
+// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x800000) expect -2.500             // Negative Full Scale
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
 //
 double MAX11410::VoltageOfCode_Bipolar_2sComplement(uint32_t value_u24)
 {
@@ -1831,11 +1888,13 @@
 // @post RTD_Temperature: Temperature calculated from RTD Resistance; Thermocouple Cold Junction, in degrees C
 //
 // @return ideal temperature in degrees C, calculated from RTD resistance in ohms
-// @test group RTD_PT1000 TemperatureOfRTD_PT1000(842.94) expect -40.0 within 0.1     PT-1000 RTD at -40C
-// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1000.0) expect 0.0   within 0.1     PT-1000 RTD at 0C
-// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1097.3) expect 25.0  within 0.1     PT-1000 RTD at 25C
-// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1328.1) expect 85.0  within 0.1     PT-1000 RTD at 85C
-// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1479.5) expect 125.0 within 0.1     PT-1000 RTD at 125C
+// @test tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test group RTD_PT1000 TemperatureOfRTD_PT1000(842.94) expect -40.0 within 0.1 // PT-1000 RTD at -40C
+// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1000.0) expect 0.0   within 0.1 // PT-1000 RTD at 0C
+// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1097.3) expect 25.0  within 0.1 // PT-1000 RTD at 25C
+// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1328.1) expect 85.0  within 0.1 // PT-1000 RTD at 85C
+// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1479.5) expect 125.0 within 0.1 // PT-1000 RTD at 125C
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
 //
 double MAX11410::TemperatureOfRTD_PT1000(double rtd_resistance)
 {
@@ -1861,11 +1920,13 @@
 // @post RTD_Temperature: Temperature calculated from RTD Resistance; Thermocouple Cold Junction, in degrees C
 //
 // @return ideal temperature in degrees C, calculated from RTD resistance in ohms
-// @test group RTD_PT100 TemperatureOfRTD_PT100(84.294) expect -40.0 within 0.1     PT-100 RTD at -40C
-// @test group RTD_PT100 TemperatureOfRTD_PT100(100.00) expect 0.0   within 0.1     PT-100 RTD at 0C
-// @test group RTD_PT100 TemperatureOfRTD_PT100(109.73) expect 25.0  within 0.1     PT-100 RTD at 25C
-// @test group RTD_PT100 TemperatureOfRTD_PT100(132.81) expect 85.0  within 0.1     PT-100 RTD at 85C
-// @test group RTD_PT100 TemperatureOfRTD_PT100(147.95) expect 125.0 within 0.1     PT-100 RTD at 125C
+// @test tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test group RTD_PT100 TemperatureOfRTD_PT100(84.294) expect -40.0 within 0.1 // PT-100 RTD at -40C
+// @test group RTD_PT100 TemperatureOfRTD_PT100(100.00) expect 0.0   within 0.1 // PT-100 RTD at 0C
+// @test group RTD_PT100 TemperatureOfRTD_PT100(109.73) expect 25.0  within 0.1 // PT-100 RTD at 25C
+// @test group RTD_PT100 TemperatureOfRTD_PT100(132.81) expect 85.0  within 0.1 // PT-100 RTD at 85C
+// @test group RTD_PT100 TemperatureOfRTD_PT100(147.95) expect 125.0 within 0.1 // PT-100 RTD at 125C
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
 //
 double MAX11410::TemperatureOfRTD_PT100(double rtd_resistance)
 {
@@ -1891,16 +1952,19 @@
 // @post RTD_Temperature: Temperature calculated from RTD Resistance; Thermocouple Cold Junction, in degrees C
 //
 // @return ideal temperature in degrees C, calculated from RTD resistance in ohms
-// @test group RTD TemperatureOfRTD(84.294) expect -40.0 within 0.1     PT-100 RTD at -40C
-// @test group RTD TemperatureOfRTD(100.00) expect 0.0   within 0.1     PT-100 RTD at 0C
-// @test group RTD TemperatureOfRTD(109.73) expect 25.0  within 0.1     PT-100 RTD at 25C
-// @test group RTD TemperatureOfRTD(132.81) expect 85.0  within 0.1     PT-100 RTD at 85C
-// @test group RTD TemperatureOfRTD(147.95) expect 125.0 within 0.1     PT-100 RTD at 125C
-// @test group RTD TemperatureOfRTD(842.94) expect -40.0 within 0.1     PT-1000 RTD at -40C
-// @test group RTD TemperatureOfRTD(1000.0) expect 0.0   within 0.1     PT-1000 RTD at 0C
-// @test group RTD TemperatureOfRTD(1097.3) expect 25.0  within 0.1     PT-1000 RTD at 25C
-// @test group RTD TemperatureOfRTD(1328.1) expect 85.0  within 0.1     PT-1000 RTD at 85C
-// @test group RTD TemperatureOfRTD(1479.5) expect 125.0 within 0.1     PT-1000 RTD at 125C
+// @test group RTD // Verify function TemperatureOfRTD
+// @test group RTD tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test group RTD TemperatureOfRTD(84.294) expect -40.0 within 0.1 // PT-100 RTD at -40C
+// @test group RTD TemperatureOfRTD(100.00) expect 0.0   within 0.1 // PT-100 RTD at 0C
+// @test group RTD TemperatureOfRTD(109.73) expect 25.0  within 0.1 // PT-100 RTD at 25C
+// @test group RTD TemperatureOfRTD(132.81) expect 85.0  within 0.1 // PT-100 RTD at 85C
+// @test group RTD TemperatureOfRTD(147.95) expect 125.0 within 0.1 // PT-100 RTD at 125C
+// @test group RTD TemperatureOfRTD(842.94) expect -40.0 within 0.1 // PT-1000 RTD at -40C
+// @test group RTD TemperatureOfRTD(1000.0) expect 0.0   within 0.1 // PT-1000 RTD at 0C
+// @test group RTD TemperatureOfRTD(1097.3) expect 25.0  within 0.1 // PT-1000 RTD at 25C
+// @test group RTD TemperatureOfRTD(1328.1) expect 85.0  within 0.1 // PT-1000 RTD at 85C
+// @test group RTD TemperatureOfRTD(1479.5) expect 125.0 within 0.1 // PT-1000 RTD at 125C
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
 //
 double MAX11410::TemperatureOfRTD(double rtd_resistance)
 {
@@ -2036,51 +2100,53 @@
 // @param[in] tc_voltage = Thermocouple voltage in volts, default=0.0254
 //
 // @return ideal temperature in degrees C, calculated from RTD resistance in ohms
-// @test group TC_1 TemperatureOfTC_TypeK(0.000e-3) expect  0.0    within 0.1    TC_TypeK at   0C = 0.000mV
-// @test group TC_1 TemperatureOfTC_TypeK(0.039e-3) expect  1.0    within 0.1    TC_TypeK at   1C = 0.039mV
-// @test group TC_1 TemperatureOfTC_TypeK(0.079e-3) expect  2.0    within 0.1    TC_TypeK at   2C = 0.079mV
-// @test group TC_1 TemperatureOfTC_TypeK(0.119e-3) expect  3.0    within 0.1    TC_TypeK at   3C = 0.119mV
-// @test group TC_2 TemperatureOfTC_TypeK(0.158e-3) expect  4.0     within 0.1   TC_TypeK at   4C = 0.158mV
-// @test group TC_2 TemperatureOfTC_TypeK(0.198e-3) expect  5.0     within 0.1   TC_TypeK at   5C = 0.198mV
-// @test group TC_2 TemperatureOfTC_TypeK(0.238e-3) expect  6.0     within 0.1   TC_TypeK at   6C = 0.238mV
-// @test group TC_2 TemperatureOfTC_TypeK(0.2775e-3) expect  7.0    within 0.1    TC_TypeK at   7C = 0.2775mV
-// @test group TC_2 TemperatureOfTC_TypeK(0.317e-3) expect  8.0     within 0.1   TC_TypeK at   8C = 0.317mV
-// @test group TC_2 TemperatureOfTC_TypeK(0.357e-3) expect  9.0     within 0.1   TC_TypeK at   9C = 0.357mV
-// @test group TC_1 TemperatureOfTC_TypeK(0.397e-3) expect 10.0    within 0.1    TC_TypeK at  10C = 0.397mV
-// @test group TC_1 TemperatureOfTC_TypeK(0.798e-3) expect 20.0    within 0.1    TC_TypeK at  20C = 0.798mV
-// @test group TC_1 TemperatureOfTC_TypeK(1.081e-3) expect 27.0    within 0.1    TC_TypeK at  27C = 1.081mV
-// @test group TC_1 TemperatureOfTC_TypeK(1.203e-3) expect 30.0    within 0.1    TC_TypeK at  30C = 1.203mV
-// @test group TC_1 TemperatureOfTC_TypeK(1.612e-3) expect 40.0    within 0.1    TC_TypeK at  40C = 1.612mV
-// @test group TC_1 TemperatureOfTC_TypeK(2.023e-3) expect 50.0    within 0.1    TC_TypeK at  50C = 2.023mV
-// @test group TC_1 TemperatureOfTC_TypeK(2.436e-3) expect 60.0    within 0.1    TC_TypeK at  60C = 2.436mV
-// @test group TC_1 TemperatureOfTC_TypeK(2.851e-3) expect 70.0    within 0.1    TC_TypeK at  70C = 2.851mV
-// @test group TC_1 TemperatureOfTC_TypeK(3.267e-3) expect 80.0    within 0.1    TC_TypeK at  80C = 3.267mV
-// @test group TC_1 TemperatureOfTC_TypeK(3.682e-3) expect 90.0    within 0.1    TC_TypeK at  90C = 3.682mV
-// @test group TC_1 TemperatureOfTC_TypeK(4.096e-3) expect 100.0   within 0.1     TC_TypeK at  100C = 4.096mV
-// @test group TC_2 TemperatureOfTC_TypeK(4.509e-3) expect 110.0    within 0.1    TC_TypeK at  110C = 4.509mV
-// @test group TC_2 TemperatureOfTC_TypeK(4.920e-3) expect 120.0    within 0.1    TC_TypeK at  120C = 4.920mV
-// @test group TC_2 TemperatureOfTC_TypeK(5.328e-3) expect 130.0    within 0.1    TC_TypeK at  130C = 5.328mV
-// @test group TC_2 TemperatureOfTC_TypeK(5.735e-3) expect 140.0    within 0.1    TC_TypeK at  140C = 5.735mV
-// @test group TC_2 TemperatureOfTC_TypeK(6.138e-3) expect 150.0    within 0.1    TC_TypeK at  150C = 6.138mV
-// @test group TC_2 TemperatureOfTC_TypeK(6.540e-3) expect 160.0    within 0.1    TC_TypeK at  160C = 6.540mV
-// @test group TC_2 TemperatureOfTC_TypeK(6.941e-3) expect 170.0    within 0.1    TC_TypeK at  170C = 6.941mV
-// @test group TC_2 TemperatureOfTC_TypeK(7.340e-3) expect 180.0    within 0.1    TC_TypeK at  180C = 7.340mV
-// @test group TC_1 TemperatureOfTC_TypeK(7.739e-3) expect 190.0   within 0.1     TC_TypeK at  190C = 7.739mV
-// @test group TC_1 TemperatureOfTC_TypeK(8.138e-3) expect 200.0   within 0.1     TC_TypeK at  200C = 8.138mV
-// @test group TC_1 TemperatureOfTC_TypeK(8.539e-3) expect 210.0   within 0.1     TC_TypeK at  210C = 8.539mV
-// @test group TC_1 TemperatureOfTC_TypeK(8.940e-3) expect 220.0   within 0.1     TC_TypeK at  220C = 8.940mV
-// @test group TC_2 TemperatureOfTC_TypeK(9.343e-3) expect 230.0    within 0.1    TC_TypeK at  230C = 9.343mV
-// @test group TC_2 TemperatureOfTC_TypeK(9.747e-3) expect 240.0    within 0.1    TC_TypeK at  240C = 9.747mV
-// @test group TC_2 TemperatureOfTC_TypeK(10.153e-3) expect 250.0   within 0.1     TC_TypeK at  250C = 10.153mV
-// @test group TC_2 TemperatureOfTC_TypeK(10.561e-3) expect 260.0   within 0.1     TC_TypeK at  260C = 10.561mV
-// @test group TC_2 TemperatureOfTC_TypeK(10.971e-3) expect 270.0   within 0.1     TC_TypeK at  270C = 10.971mV
-// @test group TC_2 TemperatureOfTC_TypeK(11.382e-3) expect 280.0   within 0.1     TC_TypeK at  280C = 11.382mV
-// @test group TC_2 TemperatureOfTC_TypeK(11.795e-3) expect 290.0   within 0.1     TC_TypeK at  290C = 11.795mV
-// @test group TC_1 TemperatureOfTC_TypeK(12.209e-3) expect 300.0  within 0.1      TC_TypeK at  300C = 12.209mV
-// @test group TC_2 TemperatureOfTC_TypeK(14.293e-3) expect 350.0   within 0.1     TC_TypeK at  350C = 14.293mV
-// @test group TC_1 TemperatureOfTC_TypeK(16.397e-3) expect 400.0  within 0.1      TC_TypeK at  400C = 16.397mV
-// @test group TC_1 TemperatureOfTC_TypeK(18.516e-3) expect 450.0  within 0.1      TC_TypeK at  450C = 18.516mV
-// @test group TC_1 TemperatureOfTC_TypeK(20.218e-3) expect 490.0        TC_TypeK at  490C = 20.218mV
+// @test tinyTester.blink_time_msec = 20 // quickly speed through the software verification
+// @test group TC_1 TemperatureOfTC_TypeK(0.000e-3) expect  0.0    within 0.1 // TC_TypeK at   0C = 0.000mV
+// @test group TC_1 TemperatureOfTC_TypeK(0.039e-3) expect  1.0    within 0.1 // TC_TypeK at   1C = 0.039mV
+// @test group TC_1 TemperatureOfTC_TypeK(0.079e-3) expect  2.0    within 0.1 // TC_TypeK at   2C = 0.079mV
+// @test group TC_1 TemperatureOfTC_TypeK(0.119e-3) expect  3.0    within 0.1 // TC_TypeK at   3C = 0.119mV
+// @test group TC_2 TemperatureOfTC_TypeK(0.158e-3) expect  4.0     within 0.1 // TC_TypeK at   4C = 0.158mV
+// @test group TC_2 TemperatureOfTC_TypeK(0.198e-3) expect  5.0     within 0.1 // TC_TypeK at   5C = 0.198mV
+// @test group TC_2 TemperatureOfTC_TypeK(0.238e-3) expect  6.0     within 0.1 // TC_TypeK at   6C = 0.238mV
+// @test group TC_2 TemperatureOfTC_TypeK(0.2775e-3) expect  7.0    within 0.1 // TC_TypeK at   7C = 0.2775mV
+// @test group TC_2 TemperatureOfTC_TypeK(0.317e-3) expect  8.0     within 0.1 // TC_TypeK at   8C = 0.317mV
+// @test group TC_2 TemperatureOfTC_TypeK(0.357e-3) expect  9.0     within 0.1 // TC_TypeK at   9C = 0.357mV
+// @test group TC_1 TemperatureOfTC_TypeK(0.397e-3) expect 10.0    within 0.1 // TC_TypeK at  10C = 0.397mV
+// @test group TC_1 TemperatureOfTC_TypeK(0.798e-3) expect 20.0    within 0.1 // TC_TypeK at  20C = 0.798mV
+// @test group TC_1 TemperatureOfTC_TypeK(1.081e-3) expect 27.0    within 0.1 // TC_TypeK at  27C = 1.081mV
+// @test group TC_1 TemperatureOfTC_TypeK(1.203e-3) expect 30.0    within 0.1 // TC_TypeK at  30C = 1.203mV
+// @test group TC_1 TemperatureOfTC_TypeK(1.612e-3) expect 40.0    within 0.1 // TC_TypeK at  40C = 1.612mV
+// @test group TC_1 TemperatureOfTC_TypeK(2.023e-3) expect 50.0    within 0.1 // TC_TypeK at  50C = 2.023mV
+// @test group TC_1 TemperatureOfTC_TypeK(2.436e-3) expect 60.0    within 0.1 // TC_TypeK at  60C = 2.436mV
+// @test group TC_1 TemperatureOfTC_TypeK(2.851e-3) expect 70.0    within 0.1 // TC_TypeK at  70C = 2.851mV
+// @test group TC_1 TemperatureOfTC_TypeK(3.267e-3) expect 80.0    within 0.1 // TC_TypeK at  80C = 3.267mV
+// @test group TC_1 TemperatureOfTC_TypeK(3.682e-3) expect 90.0    within 0.1 // TC_TypeK at  90C = 3.682mV
+// @test group TC_1 TemperatureOfTC_TypeK(4.096e-3) expect 100.0   within 0.1 // TC_TypeK at  100C = 4.096mV
+// @test group TC_2 TemperatureOfTC_TypeK(4.509e-3) expect 110.0    within 0.1 // TC_TypeK at  110C = 4.509mV
+// @test group TC_2 TemperatureOfTC_TypeK(4.920e-3) expect 120.0    within 0.1 // TC_TypeK at  120C = 4.920mV
+// @test group TC_2 TemperatureOfTC_TypeK(5.328e-3) expect 130.0    within 0.1 // TC_TypeK at  130C = 5.328mV
+// @test group TC_2 TemperatureOfTC_TypeK(5.735e-3) expect 140.0    within 0.1 // TC_TypeK at  140C = 5.735mV
+// @test group TC_2 TemperatureOfTC_TypeK(6.138e-3) expect 150.0    within 0.1 // TC_TypeK at  150C = 6.138mV
+// @test group TC_2 TemperatureOfTC_TypeK(6.540e-3) expect 160.0    within 0.1 // TC_TypeK at  160C = 6.540mV
+// @test group TC_2 TemperatureOfTC_TypeK(6.941e-3) expect 170.0    within 0.1 // TC_TypeK at  170C = 6.941mV
+// @test group TC_2 TemperatureOfTC_TypeK(7.340e-3) expect 180.0    within 0.1 // TC_TypeK at  180C = 7.340mV
+// @test group TC_1 TemperatureOfTC_TypeK(7.739e-3) expect 190.0   within 0.1 // TC_TypeK at  190C = 7.739mV
+// @test group TC_1 TemperatureOfTC_TypeK(8.138e-3) expect 200.0   within 0.1 // TC_TypeK at  200C = 8.138mV
+// @test group TC_1 TemperatureOfTC_TypeK(8.539e-3) expect 210.0   within 0.1 // TC_TypeK at  210C = 8.539mV
+// @test group TC_1 TemperatureOfTC_TypeK(8.940e-3) expect 220.0   within 0.1 // TC_TypeK at  220C = 8.940mV
+// @test group TC_2 TemperatureOfTC_TypeK(9.343e-3) expect 230.0    within 0.1 // TC_TypeK at  230C = 9.343mV
+// @test group TC_2 TemperatureOfTC_TypeK(9.747e-3) expect 240.0    within 0.1 // TC_TypeK at  240C = 9.747mV
+// @test group TC_2 TemperatureOfTC_TypeK(10.153e-3) expect 250.0   within 0.1 // TC_TypeK at  250C = 10.153mV
+// @test group TC_2 TemperatureOfTC_TypeK(10.561e-3) expect 260.0   within 0.1 // TC_TypeK at  260C = 10.561mV
+// @test group TC_2 TemperatureOfTC_TypeK(10.971e-3) expect 270.0   within 0.1 // TC_TypeK at  270C = 10.971mV
+// @test group TC_2 TemperatureOfTC_TypeK(11.382e-3) expect 280.0   within 0.1 // TC_TypeK at  280C = 11.382mV
+// @test group TC_2 TemperatureOfTC_TypeK(11.795e-3) expect 290.0   within 0.1 // TC_TypeK at  290C = 11.795mV
+// @test group TC_1 TemperatureOfTC_TypeK(12.209e-3) expect 300.0  within 0.1 // TC_TypeK at  300C = 12.209mV
+// @test group TC_2 TemperatureOfTC_TypeK(14.293e-3) expect 350.0   within 0.1 // TC_TypeK at  350C = 14.293mV
+// @test group TC_1 TemperatureOfTC_TypeK(16.397e-3) expect 400.0  within 0.1 // TC_TypeK at  400C = 16.397mV
+// @test group TC_1 TemperatureOfTC_TypeK(18.516e-3) expect 450.0  within 0.1 // TC_TypeK at  450C = 18.516mV
+// @test group TC_1 TemperatureOfTC_TypeK(20.218e-3) expect 490.0  // TC_TypeK at  490C = 20.218mV
+// @test tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
 //
 double MAX11410::TemperatureOfTC_TypeK(double tc_voltage)
 {