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sd-driver/TESTS/block_device/basic/basic.cpp
- Committer:
- mslade
- Date:
- 2018-01-09
- Revision:
- 4:019309e6090e
- Parent:
- 1:84581acd1333
File content as of revision 4:019309e6090e:
/* * mbed Microcontroller Library * Copyright (c) 2006-2016 ARM Limited * * Licensed under the Apache License, Version 2.0 (the "License"); * you may not use this file except in compliance with the License. * You may obtain a copy of the License at * * http://www.apache.org/licenses/LICENSE-2.0 * * Unless required by applicable law or agreed to in writing, software * distributed under the License is distributed on an "AS IS" BASIS, * WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied. * See the License for the specific language governing permissions and * limitations under the License. * */ /* The following copyright notice is reproduced from the glibc project * REF_LICENCE_GLIBC * * Copyright (C) 1991, 1992 Free Software Foundation, Inc. * This file is part of the GNU C Library. * * The GNU C Library is free software; you can redistribute it and/or * modify it under the terms of the GNU Library General Public License as * published by the Free Software Foundation; either version 2 of the * License, or (at your option) any later version. * * The GNU C Library is distributed in the hope that it will be useful, * but WITHOUT ANY WARRANTY; without even the implied warranty of * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU * Library General Public License for more details. * * You should have received a copy of the GNU Library General Public * License along with the GNU C Library; see the file COPYING.LIB. If * not, write to the Free Software Foundation, Inc., 675 Mass Ave, * Cambridge, MA 02139, USA. */ /** @file main.cpp Basic SD Driver Test */ #include "mbed.h" #include "greentea-client/test_env.h" #include "unity.h" #include "utest.h" #include "SDBlockDevice.h" #include <stdlib.h> using namespace utest::v1; #define TEST_BLOCK_COUNT 10 #define TEST_ERROR_MASK 16 #define TEST_BLOCK_SIZE 2048 const struct { const char *name; bd_size_t (BlockDevice::*method)() const; } ATTRS[] = { {"read size", &BlockDevice::get_read_size}, {"program size", &BlockDevice::get_program_size}, {"erase size", &BlockDevice::get_erase_size}, {"total size", &BlockDevice::size}, }; void test_read_write() { SDBlockDevice sd(MBED_CONF_SD_SPI_MOSI, MBED_CONF_SD_SPI_MISO, MBED_CONF_SD_SPI_CLK, MBED_CONF_SD_SPI_CS); int err = sd.init(); TEST_ASSERT_EQUAL(0, err); err = sd.frequency(25000000); TEST_ASSERT_EQUAL(0, err); for (unsigned a = 0; a < sizeof(ATTRS)/sizeof(ATTRS[0]); a++) { static const char *prefixes[] = {"", "k", "M", "G"}; for (int i = 3; i >= 0; i--) { bd_size_t size = (sd.*ATTRS[a].method)(); if (size >= (1ULL << 10*i)) { printf("%s: %llu%sbytes (%llubytes)\n", ATTRS[a].name, size >> 10*i, prefixes[i], size); break; } } } bd_size_t erase_size = sd.get_erase_size(); bd_size_t block_size = erase_size > TEST_BLOCK_SIZE ? erase_size : TEST_BLOCK_SIZE; uint8_t *write_block = new uint8_t[block_size]; uint8_t *read_block = new uint8_t[block_size]; uint8_t *error_mask = new uint8_t[TEST_ERROR_MASK]; unsigned addrwidth = ceil(log(float(sd.size()-1)) / log(float(16)))+1; for (int b = 0; b < TEST_BLOCK_COUNT; b++) { // Find a random block bd_addr_t block = (rand()*block_size) % sd.size(); // Use next random number as temporary seed to keep // the address progressing in the pseudorandom sequence unsigned seed = rand(); // Fill with random sequence srand(seed); for (bd_size_t i = 0; i < block_size; i++) { write_block[i] = 0xff & rand(); } // Write, sync, and read the block printf("test %0*llx:%llu...\n", addrwidth, block, block_size); err = sd.erase(block, block_size); TEST_ASSERT_EQUAL(0, err); err = sd.program(write_block, block, block_size); TEST_ASSERT_EQUAL(0, err); printf("write %0*llx:%llu ", addrwidth, block, block_size); for (int i = 0; i < 16; i++) { printf("%02x", write_block[i]); } printf("...\n"); err = sd.read(read_block, block, block_size); TEST_ASSERT_EQUAL(0, err); printf("read %0*llx:%llu ", addrwidth, block, block_size); for (int i = 0; i < 16; i++) { printf("%02x", read_block[i]); } printf("...\n"); // Find error mask for debugging memset(error_mask, 0, TEST_ERROR_MASK); bd_size_t error_scale = block_size / (TEST_ERROR_MASK*8); srand(seed); for (bd_size_t i = 0; i < TEST_ERROR_MASK*8; i++) { for (bd_size_t j = 0; j < error_scale; j++) { if ((0xff & rand()) != read_block[i*error_scale + j]) { error_mask[i/8] |= 1 << (i%8); } } } printf("error %0*llx:%llu ", addrwidth, block, block_size); for (int i = 0; i < 16; i++) { printf("%02x", error_mask[i]); } printf("\n"); // Check that the data was unmodified srand(seed); for (bd_size_t i = 0; i < block_size; i++) { TEST_ASSERT_EQUAL(0xff & rand(), read_block[i]); } } err = sd.deinit(); TEST_ASSERT_EQUAL(0, err); } // Test setup utest::v1::status_t test_setup(const size_t number_of_cases) { GREENTEA_SETUP(120, "default_auto"); return verbose_test_setup_handler(number_of_cases); } Case cases[] = { Case("Testing read write random blocks", test_read_write), }; Specification specification(test_setup, cases); int main() { return !Harness::run(specification); }