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Fork of mbed-dev by
targets/TARGET_ONSEMI/TARGET_NCS36510/test_map.h@166:33361e55dd8c, 2017-08-23 (annotated)
- Committer:
- iftaziz
- Date:
- Wed Aug 23 10:32:38 2017 +0000
- Revision:
- 166:33361e55dd8c
- Parent:
- 149:156823d33999
r1
Who changed what in which revision?
User | Revision | Line number | New contents of line |
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<> | 144:ef7eb2e8f9f7 | 1 | /** |
<> | 144:ef7eb2e8f9f7 | 2 | ****************************************************************************** |
<> | 144:ef7eb2e8f9f7 | 3 | * @file test_map.h |
<> | 144:ef7eb2e8f9f7 | 4 | * @brief Test hw module register map |
<> | 144:ef7eb2e8f9f7 | 5 | * @internal |
<> | 144:ef7eb2e8f9f7 | 6 | * @author ON Semiconductor |
<> | 144:ef7eb2e8f9f7 | 7 | * $Rev: 2848 $ |
<> | 144:ef7eb2e8f9f7 | 8 | * $Date: 2014-04-01 22:48:18 +0530 (Tue, 01 Apr 2014) $ |
<> | 144:ef7eb2e8f9f7 | 9 | ****************************************************************************** |
<> | 147:30b64687e01f | 10 | * Copyright 2016 Semiconductor Components Industries LLC (d/b/a ON Semiconductor). |
<> | 147:30b64687e01f | 11 | * All rights reserved. This software and/or documentation is licensed by ON Semiconductor |
<> | 147:30b64687e01f | 12 | * under limited terms and conditions. The terms and conditions pertaining to the software |
<> | 147:30b64687e01f | 13 | * and/or documentation are available at http://www.onsemi.com/site/pdf/ONSEMI_T&C.pdf |
<> | 147:30b64687e01f | 14 | * (ON Semiconductor Standard Terms and Conditions of Sale, Section 8 Software) and |
<> | 147:30b64687e01f | 15 | * if applicable the software license agreement. Do not use this software and/or |
<> | 147:30b64687e01f | 16 | * documentation unless you have carefully read and you agree to the limited terms and |
<> | 147:30b64687e01f | 17 | * conditions. By using this software and/or documentation, you agree to the limited |
<> | 147:30b64687e01f | 18 | * terms and conditions. |
<> | 144:ef7eb2e8f9f7 | 19 | * |
<> | 144:ef7eb2e8f9f7 | 20 | * THIS SOFTWARE IS PROVIDED "AS IS". NO WARRANTIES, WHETHER EXPRESS, IMPLIED |
<> | 144:ef7eb2e8f9f7 | 21 | * OR STATUTORY, INCLUDING, BUT NOT LIMITED TO, IMPLIED WARRANTIES OF |
<> | 144:ef7eb2e8f9f7 | 22 | * MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE APPLY TO THIS SOFTWARE. |
<> | 144:ef7eb2e8f9f7 | 23 | * ON SEMICONDUCTOR SHALL NOT, IN ANY CIRCUMSTANCES, BE LIABLE FOR SPECIAL, |
<> | 144:ef7eb2e8f9f7 | 24 | * INCIDENTAL, OR CONSEQUENTIAL DAMAGES, FOR ANY REASON WHATSOEVER. |
<> | 144:ef7eb2e8f9f7 | 25 | * @endinternal |
<> | 144:ef7eb2e8f9f7 | 26 | * |
<> | 144:ef7eb2e8f9f7 | 27 | * @ingroup test |
<> | 144:ef7eb2e8f9f7 | 28 | * |
<> | 144:ef7eb2e8f9f7 | 29 | * @details |
<> | 144:ef7eb2e8f9f7 | 30 | */ |
<> | 144:ef7eb2e8f9f7 | 31 | |
<> | 144:ef7eb2e8f9f7 | 32 | #ifndef TEST_MAP_H_ |
<> | 144:ef7eb2e8f9f7 | 33 | #define TEST_MAP_H_ |
<> | 144:ef7eb2e8f9f7 | 34 | |
<> | 144:ef7eb2e8f9f7 | 35 | /************************************************************************************************* |
<> | 144:ef7eb2e8f9f7 | 36 | * * |
<> | 144:ef7eb2e8f9f7 | 37 | * Header files * |
<> | 144:ef7eb2e8f9f7 | 38 | * * |
<> | 144:ef7eb2e8f9f7 | 39 | *************************************************************************************************/ |
<> | 144:ef7eb2e8f9f7 | 40 | |
<> | 144:ef7eb2e8f9f7 | 41 | #include "architecture.h" |
<> | 144:ef7eb2e8f9f7 | 42 | |
<> | 144:ef7eb2e8f9f7 | 43 | /************************************************************************************************** |
<> | 144:ef7eb2e8f9f7 | 44 | * * |
<> | 144:ef7eb2e8f9f7 | 45 | * Type definitions * |
<> | 144:ef7eb2e8f9f7 | 46 | * * |
<> | 144:ef7eb2e8f9f7 | 47 | **************************************************************************************************/ |
<> | 144:ef7eb2e8f9f7 | 48 | |
<> | 144:ef7eb2e8f9f7 | 49 | /** General test registers |
<> | 144:ef7eb2e8f9f7 | 50 | * |
<> | 144:ef7eb2e8f9f7 | 51 | */ |
<> | 144:ef7eb2e8f9f7 | 52 | typedef struct { |
<> | 144:ef7eb2e8f9f7 | 53 | __IO uint32_t UNLOCK; |
<> | 144:ef7eb2e8f9f7 | 54 | __IO uint32_t ANA_TEST_MUX; |
<> | 144:ef7eb2e8f9f7 | 55 | __IO uint32_t OVD_ENA_MODE; |
<> | 144:ef7eb2e8f9f7 | 56 | __IO uint32_t OVD_VAL; |
<> | 144:ef7eb2e8f9f7 | 57 | __IO uint32_t ANA_TEST_MODE; |
<> | 144:ef7eb2e8f9f7 | 58 | __IO uint32_t CLK_TEST_MODE; |
<> | 144:ef7eb2e8f9f7 | 59 | union { |
<> | 144:ef7eb2e8f9f7 | 60 | struct { |
<> | 144:ef7eb2e8f9f7 | 61 | __IO uint32_t PAD0:1; |
<> | 144:ef7eb2e8f9f7 | 62 | __IO uint32_t PAD1:1; |
<> | 144:ef7eb2e8f9f7 | 63 | __IO uint32_t FORCE_SOURCE:1; |
<> | 144:ef7eb2e8f9f7 | 64 | __IO uint32_t FORCE_SINK:1; |
<> | 144:ef7eb2e8f9f7 | 65 | __IO uint32_t PD_CONTROL:3; |
<> | 144:ef7eb2e8f9f7 | 66 | __IO uint32_t PAD3:1; |
<> | 144:ef7eb2e8f9f7 | 67 | __IO uint32_t BYPASS_PLL_REG:1; |
<> | 144:ef7eb2e8f9f7 | 68 | __IO uint32_t PAD4:4; |
<> | 144:ef7eb2e8f9f7 | 69 | __IO uint32_t DITHER_MODE:1; |
<> | 144:ef7eb2e8f9f7 | 70 | __IO uint32_t PLL_MODE:1; |
<> | 144:ef7eb2e8f9f7 | 71 | __IO uint32_t FORCE_LOCK:1; |
<> | 144:ef7eb2e8f9f7 | 72 | } BITS; |
<> | 144:ef7eb2e8f9f7 | 73 | __IO uint32_t WORD; |
<> | 144:ef7eb2e8f9f7 | 74 | } PLL_TEST_MODE; |
<> | 144:ef7eb2e8f9f7 | 75 | __IO uint32_t RX_TEST_MODE; |
<> | 144:ef7eb2e8f9f7 | 76 | __IO uint32_t PMU_TEST_MODE; |
<> | 144:ef7eb2e8f9f7 | 77 | } TestReg_t, *TestReg_pt; |
<> | 144:ef7eb2e8f9f7 | 78 | |
<> | 144:ef7eb2e8f9f7 | 79 | /** Digital test registers |
<> | 144:ef7eb2e8f9f7 | 80 | * |
<> | 144:ef7eb2e8f9f7 | 81 | */ |
<> | 144:ef7eb2e8f9f7 | 82 | typedef struct { |
<> | 144:ef7eb2e8f9f7 | 83 | union { |
<> | 144:ef7eb2e8f9f7 | 84 | struct { |
<> | 144:ef7eb2e8f9f7 | 85 | __IO uint32_t PAD0 :4; /**< */ |
<> | 144:ef7eb2e8f9f7 | 86 | __IO uint32_t DIO4 :4; /**< DIO4 Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 87 | __IO uint32_t DIO5 :4; /**< DIO5 Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 88 | __IO uint32_t DIO6 :4; /**< DIO6 Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 89 | __IO uint32_t DIO7 :4; /**< DIO7 Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 90 | __IO uint32_t DIO8 :4; /**< DIO8 Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 91 | __IO uint32_t DIO9 :4; /**< DIO9 Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 92 | __IO uint32_t DIO10 :4; /**< DIO10 Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 93 | } BITS; |
<> | 144:ef7eb2e8f9f7 | 94 | __IO uint32_t WORD; |
<> | 144:ef7eb2e8f9f7 | 95 | } DIG_TEST_MUX; |
<> | 144:ef7eb2e8f9f7 | 96 | __IO uint32_t DIG_TEST_MODE; |
<> | 144:ef7eb2e8f9f7 | 97 | union { |
<> | 144:ef7eb2e8f9f7 | 98 | struct { |
<> | 144:ef7eb2e8f9f7 | 99 | __IO uint32_t PAD0 :12; /**< */ |
<> | 144:ef7eb2e8f9f7 | 100 | __IO uint32_t DIO5 :3; /**< DIO5 Input Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 101 | __IO uint32_t DIO6 :3; /**< DIO6 Input Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 102 | __IO uint32_t DIO7 :3; /**< DIO7 Input Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 103 | __IO uint32_t DIO8 :3; /**< DIO8 Input Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 104 | __IO uint32_t DIO9 :3; /**< DIO9 Input Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 105 | __IO uint32_t DIO10 :3; /**< DIO10 Input Test Mux Control */ |
<> | 144:ef7eb2e8f9f7 | 106 | } BITS; |
<> | 144:ef7eb2e8f9f7 | 107 | __IO uint32_t WORD; |
<> | 144:ef7eb2e8f9f7 | 108 | } DIG_IN_TEST_MUX; |
<> | 144:ef7eb2e8f9f7 | 109 | __IO uint32_t SCAN_MODE; |
<> | 144:ef7eb2e8f9f7 | 110 | __IO uint32_t BIST_TEST_MUX; |
<> | 144:ef7eb2e8f9f7 | 111 | __IO uint32_t RAM_DIAG_ADDR; |
<> | 144:ef7eb2e8f9f7 | 112 | __IO uint32_t RAM_DIAG_DATA; |
<> | 144:ef7eb2e8f9f7 | 113 | __IO uint32_t SRAMA_DIAG_COMP; |
<> | 144:ef7eb2e8f9f7 | 114 | __IO uint32_t SRAMB_DIAG_COMP; |
<> | 144:ef7eb2e8f9f7 | 115 | __IO uint32_t RAM_BUF_TEST_MODE; |
<> | 144:ef7eb2e8f9f7 | 116 | } TestDigReg_t, *TestDigReg_pt; |
<> | 144:ef7eb2e8f9f7 | 117 | |
<> | 144:ef7eb2e8f9f7 | 118 | /** NVM test registers |
<> | 144:ef7eb2e8f9f7 | 119 | * |
<> | 144:ef7eb2e8f9f7 | 120 | */ |
<> | 144:ef7eb2e8f9f7 | 121 | typedef struct { |
<> | 144:ef7eb2e8f9f7 | 122 | __O uint32_t PAD; |
<> | 144:ef7eb2e8f9f7 | 123 | } TestNvmReg_t, *TestNvmReg_pt; |
<> | 144:ef7eb2e8f9f7 | 124 | |
<> | 144:ef7eb2e8f9f7 | 125 | #endif /* TEST_MAP_H_ */ |