V1.1 For EVIC

Dependencies:   SDFileSystem max32630fthr USBDevice

Revision:
3:35b05d91568d
Parent:
1:7530b7eb757a
--- a/DUT_RegConfig.h	Thu May 28 02:32:15 2020 +0000
+++ b/DUT_RegConfig.h	Mon Jun 22 05:27:48 2020 +0000
@@ -28,9 +28,11 @@
         uint8_t value;
 }DUTREG;
 
+void DeviceAllInit(uint8_t rco, uint8_t tdc, uint8_t dcr);
+
 void DUT_FirmwareInit(void);
 void ChipInitReset(void);
-void DUT_RegInit(void);
+void DUT_RegInit(uint8_t rco, uint8_t tdc, uint8_t dcr);
 void Enable_DUT_Interrupt(void);
 void Disable_DUT_Interrupt(void);
 void InterruptHandle(void);
@@ -43,14 +45,17 @@
 uint8_t ReadAllRegToTable(void);
 uint8_t WriteFW(uint16_t size);
 uint8_t vangogh_ram_rd(uint8_t tdc);
-uint8_t OneTimeMeasure(uint16_t *lsb, uint16_t *milimeter);
+uint8_t OneTimeMeasure(uint16_t *lsb, uint16_t *milimeter, uint32_t *peak, uint16_t *noise_level);
 uint8_t ContinuousMeasure(void);
-uint8_t RaadContinuousMeasure(uint16_t *lsb, uint16_t *milimeter);
+uint8_t RaadContinuousMeasure(uint16_t *lsb, uint16_t *milimeter, uint32_t *peak, uint16_t *noise_level);
 uint8_t StopContinuousMeasure(void);
 uint8_t DCRTest(uint8_t vspad, uint8_t test_time);
 uint8_t DelayLineTest(uint8_t phase, uint8_t* buf);
 uint8_t GetTdcPhase(uint8_t* buf);
-
+uint8_t SetWindow(uint8_t* pd);
+uint8_t RCO_Trim(uint8_t *rco);
+uint8_t BVD_Trim(uint8_t *bvd);
+uint8_t Pixel_Enable(uint8_t *buf);
 
 
 void StoreHistogram(uint16_t histogram_pos, uint16_t histogram_num, uint8_t tdc);