TEST_CODE_ApplyTo2V1_API

Dependencies:   SDFileSystem max32630fthr USBDevice

Revision:
4:217334c3a5b2
Parent:
3:35b05d91568d
--- a/DUT_RegConfig.h	Mon Jun 22 05:27:48 2020 +0000
+++ b/DUT_RegConfig.h	Tue Jul 28 01:40:05 2020 +0000
@@ -39,15 +39,17 @@
 
 void ContinuousMeasureReport();
 void HistogramReport();
+void AutoSingleMeasurment();
 
 uint8_t WriteOneReg(uint8_t addr, uint8_t data);
 uint8_t ReadOneReg(uint8_t addr, uint8_t *data);
 uint8_t ReadAllRegToTable(void);
 uint8_t WriteFW(uint16_t size);
 uint8_t vangogh_ram_rd(uint8_t tdc);
-uint8_t OneTimeMeasure(uint16_t *lsb, uint16_t *milimeter, uint32_t *peak, uint16_t *noise_level);
+uint8_t vangogh_ram_rd_ma(void);
+uint8_t OneTimeMeasure(uint16_t *lsb, uint16_t *milimeter, uint32_t *peak, uint16_t *noise_level, uint16_t *ref_lsb, uint16_t *ref_milimeter);
 uint8_t ContinuousMeasure(void);
-uint8_t RaadContinuousMeasure(uint16_t *lsb, uint16_t *milimeter, uint32_t *peak, uint16_t *noise_level);
+uint8_t RaadContinuousMeasure(uint16_t *lsb, uint16_t *milimeter, uint32_t *peak, uint16_t *noise_level, uint16_t *ref_lsb, uint16_t *ref_milimeter);
 uint8_t StopContinuousMeasure(void);
 uint8_t DCRTest(uint8_t vspad, uint8_t test_time);
 uint8_t DelayLineTest(uint8_t phase, uint8_t* buf);
@@ -56,7 +58,9 @@
 uint8_t RCO_Trim(uint8_t *rco);
 uint8_t BVD_Trim(uint8_t *bvd);
 uint8_t Pixel_Enable(uint8_t *buf);
-
+uint8_t MP_Slect(uint8_t *buf);
+uint8_t OTP_Write(uint8_t *buf);
+uint8_t OTP_Read(uint8_t* in, uint8_t* out);
 
 void StoreHistogram(uint16_t histogram_pos, uint16_t histogram_num, uint8_t tdc);