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Dependents:   mbed-TFT-example-NCS36510 mbed-Accelerometer-example-NCS36510 mbed-Accelerometer-example-NCS36510

targets/TARGET_ONSEMI/TARGET_NCS36510/test_map.h@0:098463de4c5d, 2017-01-25 (annotated)

Committer:
group-onsemi
Date:
Wed Jan 25 20:34:15 2017 +0000
Revision:
0:098463de4c5d
Initial commit

Who changed what in which revision?

UserRevisionLine numberNew contents of line
group-onsemi 0:098463de4c5d 1 /**
group-onsemi 0:098463de4c5d 2 ******************************************************************************
group-onsemi 0:098463de4c5d 3 * @file test_map.h
group-onsemi 0:098463de4c5d 4 * @brief Test hw module register map
group-onsemi 0:098463de4c5d 5 * @internal
group-onsemi 0:098463de4c5d 6 * @author ON Semiconductor
group-onsemi 0:098463de4c5d 7 * $Rev: 2848 $
group-onsemi 0:098463de4c5d 8 * $Date: 2014-04-01 22:48:18 +0530 (Tue, 01 Apr 2014) $
group-onsemi 0:098463de4c5d 9 ******************************************************************************
group-onsemi 0:098463de4c5d 10 * Copyright 2016 Semiconductor Components Industries LLC (d/b/a “ON Semiconductor”).
group-onsemi 0:098463de4c5d 11 * All rights reserved. This software and/or documentation is licensed by ON Semiconductor
group-onsemi 0:098463de4c5d 12 * under limited terms and conditions. The terms and conditions pertaining to the software
group-onsemi 0:098463de4c5d 13 * and/or documentation are available at http://www.onsemi.com/site/pdf/ONSEMI_T&C.pdf
group-onsemi 0:098463de4c5d 14 * (“ON Semiconductor Standard Terms and Conditions of Sale, Section 8 Software”) and
group-onsemi 0:098463de4c5d 15 * if applicable the software license agreement. Do not use this software and/or
group-onsemi 0:098463de4c5d 16 * documentation unless you have carefully read and you agree to the limited terms and
group-onsemi 0:098463de4c5d 17 * conditions. By using this software and/or documentation, you agree to the limited
group-onsemi 0:098463de4c5d 18 * terms and conditions.
group-onsemi 0:098463de4c5d 19 *
group-onsemi 0:098463de4c5d 20 * THIS SOFTWARE IS PROVIDED "AS IS". NO WARRANTIES, WHETHER EXPRESS, IMPLIED
group-onsemi 0:098463de4c5d 21 * OR STATUTORY, INCLUDING, BUT NOT LIMITED TO, IMPLIED WARRANTIES OF
group-onsemi 0:098463de4c5d 22 * MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE APPLY TO THIS SOFTWARE.
group-onsemi 0:098463de4c5d 23 * ON SEMICONDUCTOR SHALL NOT, IN ANY CIRCUMSTANCES, BE LIABLE FOR SPECIAL,
group-onsemi 0:098463de4c5d 24 * INCIDENTAL, OR CONSEQUENTIAL DAMAGES, FOR ANY REASON WHATSOEVER.
group-onsemi 0:098463de4c5d 25 * @endinternal
group-onsemi 0:098463de4c5d 26 *
group-onsemi 0:098463de4c5d 27 * @ingroup test
group-onsemi 0:098463de4c5d 28 *
group-onsemi 0:098463de4c5d 29 * @details
group-onsemi 0:098463de4c5d 30 */
group-onsemi 0:098463de4c5d 31
group-onsemi 0:098463de4c5d 32 #ifndef TEST_MAP_H_
group-onsemi 0:098463de4c5d 33 #define TEST_MAP_H_
group-onsemi 0:098463de4c5d 34
group-onsemi 0:098463de4c5d 35 /*************************************************************************************************
group-onsemi 0:098463de4c5d 36 * *
group-onsemi 0:098463de4c5d 37 * Header files *
group-onsemi 0:098463de4c5d 38 * *
group-onsemi 0:098463de4c5d 39 *************************************************************************************************/
group-onsemi 0:098463de4c5d 40
group-onsemi 0:098463de4c5d 41 #include "architecture.h"
group-onsemi 0:098463de4c5d 42
group-onsemi 0:098463de4c5d 43 /**************************************************************************************************
group-onsemi 0:098463de4c5d 44 * *
group-onsemi 0:098463de4c5d 45 * Type definitions *
group-onsemi 0:098463de4c5d 46 * *
group-onsemi 0:098463de4c5d 47 **************************************************************************************************/
group-onsemi 0:098463de4c5d 48
group-onsemi 0:098463de4c5d 49 /** General test registers
group-onsemi 0:098463de4c5d 50 *
group-onsemi 0:098463de4c5d 51 */
group-onsemi 0:098463de4c5d 52 typedef struct {
group-onsemi 0:098463de4c5d 53 __IO uint32_t UNLOCK;
group-onsemi 0:098463de4c5d 54 __IO uint32_t ANA_TEST_MUX;
group-onsemi 0:098463de4c5d 55 __IO uint32_t OVD_ENA_MODE;
group-onsemi 0:098463de4c5d 56 __IO uint32_t OVD_VAL;
group-onsemi 0:098463de4c5d 57 __IO uint32_t ANA_TEST_MODE;
group-onsemi 0:098463de4c5d 58 __IO uint32_t CLK_TEST_MODE;
group-onsemi 0:098463de4c5d 59 union {
group-onsemi 0:098463de4c5d 60 struct {
group-onsemi 0:098463de4c5d 61 __IO uint32_t PAD0:1;
group-onsemi 0:098463de4c5d 62 __IO uint32_t PAD1:1;
group-onsemi 0:098463de4c5d 63 __IO uint32_t FORCE_SOURCE:1;
group-onsemi 0:098463de4c5d 64 __IO uint32_t FORCE_SINK:1;
group-onsemi 0:098463de4c5d 65 __IO uint32_t PD_CONTROL:3;
group-onsemi 0:098463de4c5d 66 __IO uint32_t PAD3:1;
group-onsemi 0:098463de4c5d 67 __IO uint32_t BYPASS_PLL_REG:1;
group-onsemi 0:098463de4c5d 68 __IO uint32_t PAD4:4;
group-onsemi 0:098463de4c5d 69 __IO uint32_t DITHER_MODE:1;
group-onsemi 0:098463de4c5d 70 __IO uint32_t PLL_MODE:1;
group-onsemi 0:098463de4c5d 71 __IO uint32_t FORCE_LOCK:1;
group-onsemi 0:098463de4c5d 72 } BITS;
group-onsemi 0:098463de4c5d 73 __IO uint32_t WORD;
group-onsemi 0:098463de4c5d 74 } PLL_TEST_MODE;
group-onsemi 0:098463de4c5d 75 __IO uint32_t RX_TEST_MODE;
group-onsemi 0:098463de4c5d 76 __IO uint32_t PMU_TEST_MODE;
group-onsemi 0:098463de4c5d 77 } TestReg_t, *TestReg_pt;
group-onsemi 0:098463de4c5d 78
group-onsemi 0:098463de4c5d 79 /** Digital test registers
group-onsemi 0:098463de4c5d 80 *
group-onsemi 0:098463de4c5d 81 */
group-onsemi 0:098463de4c5d 82 typedef struct {
group-onsemi 0:098463de4c5d 83 union {
group-onsemi 0:098463de4c5d 84 struct {
group-onsemi 0:098463de4c5d 85 __IO uint32_t PAD0 :4; /**< */
group-onsemi 0:098463de4c5d 86 __IO uint32_t DIO4 :4; /**< DIO4 Test Mux Control */
group-onsemi 0:098463de4c5d 87 __IO uint32_t DIO5 :4; /**< DIO5 Test Mux Control */
group-onsemi 0:098463de4c5d 88 __IO uint32_t DIO6 :4; /**< DIO6 Test Mux Control */
group-onsemi 0:098463de4c5d 89 __IO uint32_t DIO7 :4; /**< DIO7 Test Mux Control */
group-onsemi 0:098463de4c5d 90 __IO uint32_t DIO8 :4; /**< DIO8 Test Mux Control */
group-onsemi 0:098463de4c5d 91 __IO uint32_t DIO9 :4; /**< DIO9 Test Mux Control */
group-onsemi 0:098463de4c5d 92 __IO uint32_t DIO10 :4; /**< DIO10 Test Mux Control */
group-onsemi 0:098463de4c5d 93 } BITS;
group-onsemi 0:098463de4c5d 94 __IO uint32_t WORD;
group-onsemi 0:098463de4c5d 95 } DIG_TEST_MUX;
group-onsemi 0:098463de4c5d 96 __IO uint32_t DIG_TEST_MODE;
group-onsemi 0:098463de4c5d 97 union {
group-onsemi 0:098463de4c5d 98 struct {
group-onsemi 0:098463de4c5d 99 __IO uint32_t PAD0 :12; /**< */
group-onsemi 0:098463de4c5d 100 __IO uint32_t DIO5 :3; /**< DIO5 Input Test Mux Control */
group-onsemi 0:098463de4c5d 101 __IO uint32_t DIO6 :3; /**< DIO6 Input Test Mux Control */
group-onsemi 0:098463de4c5d 102 __IO uint32_t DIO7 :3; /**< DIO7 Input Test Mux Control */
group-onsemi 0:098463de4c5d 103 __IO uint32_t DIO8 :3; /**< DIO8 Input Test Mux Control */
group-onsemi 0:098463de4c5d 104 __IO uint32_t DIO9 :3; /**< DIO9 Input Test Mux Control */
group-onsemi 0:098463de4c5d 105 __IO uint32_t DIO10 :3; /**< DIO10 Input Test Mux Control */
group-onsemi 0:098463de4c5d 106 } BITS;
group-onsemi 0:098463de4c5d 107 __IO uint32_t WORD;
group-onsemi 0:098463de4c5d 108 } DIG_IN_TEST_MUX;
group-onsemi 0:098463de4c5d 109 __IO uint32_t SCAN_MODE;
group-onsemi 0:098463de4c5d 110 __IO uint32_t BIST_TEST_MUX;
group-onsemi 0:098463de4c5d 111 __IO uint32_t RAM_DIAG_ADDR;
group-onsemi 0:098463de4c5d 112 __IO uint32_t RAM_DIAG_DATA;
group-onsemi 0:098463de4c5d 113 __IO uint32_t SRAMA_DIAG_COMP;
group-onsemi 0:098463de4c5d 114 __IO uint32_t SRAMB_DIAG_COMP;
group-onsemi 0:098463de4c5d 115 __IO uint32_t RAM_BUF_TEST_MODE;
group-onsemi 0:098463de4c5d 116 } TestDigReg_t, *TestDigReg_pt;
group-onsemi 0:098463de4c5d 117
group-onsemi 0:098463de4c5d 118 /** NVM test registers
group-onsemi 0:098463de4c5d 119 *
group-onsemi 0:098463de4c5d 120 */
group-onsemi 0:098463de4c5d 121 typedef struct {
group-onsemi 0:098463de4c5d 122 __O uint32_t PAD;
group-onsemi 0:098463de4c5d 123 } TestNvmReg_t, *TestNvmReg_pt;
group-onsemi 0:098463de4c5d 124
group-onsemi 0:098463de4c5d 125 #endif /* TEST_MAP_H_ */