Maxim Integrated
/
MAX11410BOB_Serial_Tester
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Dependencies: MaximTinyTester MAX11410 CmdLine USBDevice
Diff: Test_Main_MAX11410.cpp
- Revision:
- 63:708490d6a29f
- Parent:
- 61:38ec81c33b7a
- Child:
- 64:5e9555fda955
--- a/Test_Main_MAX11410.cpp Tue Apr 07 05:32:28 2020 +0000
+++ b/Test_Main_MAX11410.cpp Mon Apr 13 03:02:14 2020 +0000
@@ -1818,21 +1818,46 @@
// functions tested by SelfTest()
extern uint8_t fn_MAX11410_Init(void);
extern uint8_t fn_MAX11410_RegRead(int commandByte, uint32_t* ptrRegData);
-extern uint8_t fn_MAX11410_RegWrite(int commandByte, int regData);
-extern uint8_t fn_MAX11410_Configure_CTRL_REF(int ref_sel);
-extern uint8_t fn_MAX11410_Configure_PGA(int sigpath, int gain);
-extern double fn_MAX11410_VoltageOfCode_Unipolar(int value_u24);
-extern double fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary(int value_u24);
-extern double fn_MAX11410_VoltageOfCode_Bipolar_2sComplement(int value_u24);
-extern double fn_MAX11410_TemperatureOfRTD_PT1000(double rtd_resistance);
-extern double fn_MAX11410_TemperatureOfRTD_PT100(double rtd_resistance);
-extern double fn_MAX11410_TemperatureOfRTD(double rtd_resistance);
-extern double fn_MAX11410_TemperatureOfTC_TypeK(double tc_voltage);
+extern uint8_t fn_MAX11410_RegWrite(int commandByte, uint32_t regData);
+extern double fn_MAX11410_Measure_Voltage(int ainp, int ainn);
+extern uint8_t fn_MAX11410_Configure_CTRL_REF(uint8_t ref_sel);
+extern uint8_t fn_MAX11410_Configure_PGA(uint8_t sigpath, uint8_t gain);
+extern double fn_MAX11410_VoltageOfCode_Unipolar(uint32_t value_u24);
+extern double fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary(uint32_t value_u24);
+extern double fn_MAX11410_VoltageOfCode_Bipolar_2sComplement(uint32_t value_u24);
+extern double fn_MAX11410_TemperatureOfRTD_PT1000(double rtd_ohm);
+extern double fn_MAX11410_TemperatureOfRTD_PT100(double rtd_ohm);
+extern double fn_MAX11410_TemperatureOfRTD(double rtd_ohm);
+extern double fn_MAX11410_TemperatureOfTC_TypeK(double tc_v);
//--------------------------------------------------
// optional self-test groups for self test function SelfTest()
// enable by changing the #define value from 0 to 1
+// SelfTest group POR description:
+// verify initial register values (enabled by default)
+#ifndef MAX11410_SELFTEST_POR
+#define MAX11410_SELFTEST_POR 1
+#endif
+
+// SelfTest group RES1KA0A1TOGND description:
+// measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v (disabled by default)
+#ifndef MAX11410_SELFTEST_RES1KA0A1TOGND
+#define MAX11410_SELFTEST_RES1KA0A1TOGND 1
+#endif
+
+// SelfTest group RES1KA0A1TOGNDMORE description:
+// measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v in more detail
+#ifndef MAX11410_SELFTEST_RES1KA0A1TOGNDMORE
+#define MAX11410_SELFTEST_RES1KA0A1TOGNDMORE 1
+#endif
+
+// SelfTest group RES1KA0A1TOGND_BAD description:
+// function Measure_Voltage
+#ifndef MAX11410_SELFTEST_RES1KA0A1TOGND_BAD
+#define MAX11410_SELFTEST_RES1KA0A1TOGND_BAD 1
+#endif
+
// SelfTest group UNIPOLAR description:
// Verify function VoltageOfCode_Unipolar
#ifndef MAX11410_SELFTEST_UNIPOLAR
@@ -1938,173 +1963,447 @@
// docTest_item['expect-value'] = '1'
// call-function
// ASSERT_EQ(g_MAX11410_device.Init(()), (uint8_t)1); //
- tinyTester.FunctionCall_Expect("MAX11410.Init", fn_MAX11410_Init, /* empty docTest_argList */ /* expect: */ (uint8_t)1); //
-
- // @test RegRead(MAX11410::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, buffer) expect 1 expect-buffer 0x000F02
+ tinyTester.FunctionCall_su_Expect("MAX11410.Init", fn_MAX11410_Init, /* empty docTest_argList */ /* expect: */ (uint8_t)1); //
+
+ // @test group POR // verify initial register values (enabled by default)
+ // @test group POR RegRead(MAX11410::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, buffer) expect 1 expect-buffer 0x000F02
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, buffer) expect 1 expect-buffer 0x000F02'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x000F02'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x000F02
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x000F02); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r001_0001_xxxx_xxxx_xxxx_xxxx_xxxx_xddd_PART_ID, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x000F02); //
} // expect-buffer 0x000F02
-
- // @test RegRead(MAX11410::CMD_r000_0100_dddd_xddd_GP0_CTRL, buffer) expect 1 expect-buffer 0x00
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_0100_dddd_xddd_GP0_CTRL, buffer) expect 1 expect-buffer 0x00
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_0100_dddd_xddd_GP0_CTRL, buffer) expect 1 expect-buffer 0x00'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_0100_dddd_xddd_GP0_CTRL, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x00'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0100_dddd_xddd_GP0_CTRL, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x00
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0100_dddd_xddd_GP0_CTRL, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0100_dddd_xddd_GP0_CTRL, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
} // expect-buffer 0x00
-
- // @test RegRead(MAX11410::CMD_r000_0101_dddd_xddd_GP1_CTRL, buffer) expect 1 expect-buffer 0x00
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_0101_dddd_xddd_GP1_CTRL, buffer) expect 1 expect-buffer 0x00
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_0101_dddd_xddd_GP1_CTRL, buffer) expect 1 expect-buffer 0x00'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_0101_dddd_xddd_GP1_CTRL, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x00'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0101_dddd_xddd_GP1_CTRL, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x00
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0101_dddd_xddd_GP1_CTRL, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0101_dddd_xddd_GP1_CTRL, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
} // expect-buffer 0x00
-
- // @test RegRead(MAX11410::CMD_r000_0111_xddd_dddd_GP_SEQ_ADDR, buffer) expect 1 expect-buffer 0x00003a
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_0111_xddd_dddd_GP_SEQ_ADDR, buffer) expect 1 expect-buffer 0x00003a
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_0111_xddd_dddd_GP_SEQ_ADDR, buffer) expect 1 expect-buffer 0x00003a'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_0111_xddd_dddd_GP_SEQ_ADDR, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x00003a'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0111_xddd_dddd_GP_SEQ_ADDR, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x00003a
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0111_xddd_dddd_GP_SEQ_ADDR, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00003a); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_0111_xddd_dddd_GP_SEQ_ADDR, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00003a); //
} // expect-buffer 0x00003a
-
- // @test RegRead(MAX11410::CMD_r000_1000_x0dd_dddd_FILTER, buffer) expect 1 expect-buffer 0x00
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_1000_x0dd_dddd_FILTER, buffer) expect 1 expect-buffer 0x00
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_1000_x0dd_dddd_FILTER, buffer) expect 1 expect-buffer 0x00'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_1000_x0dd_dddd_FILTER, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x00'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1000_x0dd_dddd_FILTER, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x00
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1000_x0dd_dddd_FILTER, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1000_x0dd_dddd_FILTER, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
} // expect-buffer 0x00
-
- // @test RegRead(MAX11410::CMD_r000_1001_dddd_dddd_CTRL, buffer) expect 1 expect-buffer 0x000001
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_1001_dddd_dddd_CTRL, buffer) expect 1 expect-buffer 0x000001
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_1001_dddd_dddd_CTRL, buffer) expect 1 expect-buffer 0x000001'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_1001_dddd_dddd_CTRL, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x000001'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1001_dddd_dddd_CTRL, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x000001
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1001_dddd_dddd_CTRL, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x000001); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1001_dddd_dddd_CTRL, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x000001); //
} // expect-buffer 0x000001
-
- // @test RegRead(MAX11410::CMD_r000_1010_dddd_dddd_SOURCE, buffer) expect 1 expect-buffer 0x00
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_1010_dddd_dddd_SOURCE, buffer) expect 1 expect-buffer 0x00
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_1010_dddd_dddd_SOURCE, buffer) expect 1 expect-buffer 0x00'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_1010_dddd_dddd_SOURCE, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x00'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1010_dddd_dddd_SOURCE, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x00
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1010_dddd_dddd_SOURCE, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1010_dddd_dddd_SOURCE, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
} // expect-buffer 0x00
-
- // @test RegRead(MAX11410::CMD_r000_1011_dddd_dddd_MUX_CTRL0, buffer) expect 1 expect-buffer 0x0000ff
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_1011_dddd_dddd_MUX_CTRL0, buffer) expect 1 expect-buffer 0x0000ff
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_1011_dddd_dddd_MUX_CTRL0, buffer) expect 1 expect-buffer 0x0000ff'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_1011_dddd_dddd_MUX_CTRL0, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x0000ff'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1011_dddd_dddd_MUX_CTRL0, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x0000ff
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1011_dddd_dddd_MUX_CTRL0, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x0000ff); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1011_dddd_dddd_MUX_CTRL0, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x0000ff); //
} // expect-buffer 0x0000ff
-
- // @test RegRead(MAX11410::CMD_r000_1100_dddd_dddd_MUX_CTRL1, buffer) expect 1 expect-buffer 0x0000ff
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_1100_dddd_dddd_MUX_CTRL1, buffer) expect 1 expect-buffer 0x0000ff
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_1100_dddd_dddd_MUX_CTRL1, buffer) expect 1 expect-buffer 0x0000ff'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_1100_dddd_dddd_MUX_CTRL1, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x0000ff'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1100_dddd_dddd_MUX_CTRL1, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x0000ff
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1100_dddd_dddd_MUX_CTRL1, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x0000ff); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1100_dddd_dddd_MUX_CTRL1, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x0000ff); //
} // expect-buffer 0x0000ff
-
- // @test RegRead(MAX11410::CMD_r000_1101_dddd_dddd_MUX_CTRL2, buffer) expect 1 expect-buffer 0x00
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_1101_dddd_dddd_MUX_CTRL2, buffer) expect 1 expect-buffer 0x00
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_1101_dddd_dddd_MUX_CTRL2, buffer) expect 1 expect-buffer 0x00'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_1101_dddd_dddd_MUX_CTRL2, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x00'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1101_dddd_dddd_MUX_CTRL2, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x00
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1101_dddd_dddd_MUX_CTRL2, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1101_dddd_dddd_MUX_CTRL2, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
} // expect-buffer 0x00
-
- // @test RegRead(MAX11410::CMD_r000_1110_xxdd_xddd_PGA, buffer) expect 1 expect-buffer 0x00
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group POR RegRead(MAX11410::CMD_r000_1110_xxdd_xddd_PGA, buffer) expect 1 expect-buffer 0x00
// docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'POR'
// docTest_item['action'] = 'RegRead(MAX11410::CMD_r000_1110_xxdd_xddd_PGA, buffer) expect 1 expect-buffer 0x00'
// docTest_item['funcName'] = 'RegRead'
// docTest_item['arglist'] = 'MAX11410::CMD_r000_1110_xxdd_xddd_PGA, buffer'
// docTest_item['expect-value'] = '1'
// docTest_item['expect-buffer-value'] = '0x00'
+#if MAX11410_SELFTEST_POR // group POR RegRead
// call-function
// ASSERT_EQ(g_MAX11410_device.RegRead((MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1110_xxdd_xddd_PGA, (uint32_t*)buffer), (uint8_t)1); //
{ // expect-buffer 0x00
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1110_xxdd_xddd_PGA, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)MAX11410::CMD_r000_1110_xxdd_xddd_PGA, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x00); //
} // expect-buffer 0x00
-
+#endif // MAX11410_SELFTEST_POR // group POR
+
+ // @test group RES1KA0A1TOGND // measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v (disabled by default)
+ // @test group RES1KA0A1TOGNDMORE // measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v in more detail
+ // @test group RES1KA0A1TOGNDMORE tinyTester.print("measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v")
+ // docTest_item['actionType'] = 'print-string'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'tinyTester.print("measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v")'
+ // docTest_item['arglist'] = 'measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE None
+ // print-string
+ // tinyTesterFuncName = "tinyTester.print"
+ // tinyTesterPrintStringLiteral = "measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v"
+ tinyTester.print("measure a 1kohm resistor between (AIN0,AIN1) and AGND to verify ref2_v");
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGND tinyTester.settle_time_msec = 1000 // default 250
+ // docTest_item['actionType'] = 'assign-propname-value'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND'
+ // docTest_item['action'] = 'tinyTester.settle_time_msec = 1000'
+ // docTest_item['remarks'] = 'default 250'
+ // docTest_item['propName'] = 'tinyTester.settle_time_msec'
+ // docTest_item['propValue'] = '1000'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND None default 250
+ // assign-propname-value
+ // tinyTesterPropName = "tinyTester.settle_time_msec"
+ // tinyTesterPropValue = "1000"
+ tinyTester.settle_time_msec = 1000;
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND
+
+ // @test group RES1KA0A1TOGND RegWrite(0x0C, 0xF1) expect 1 // *mux_ctrl1=0xf1 drives current source from AIN1
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND'
+ // docTest_item['action'] = 'RegWrite(0x0C, 0xF1) expect 1'
+ // docTest_item['remarks'] = '*mux_ctrl1=0xf1 drives current source from AIN1'
+ // docTest_item['funcName'] = 'RegWrite'
+ // docTest_item['arglist'] = '0x0C, 0xF1'
+ // docTest_item['expect-value'] = '1'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND RegWrite *mux_ctrl1=0xf1 drives current source from AIN1
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.RegWrite((MAX11410::MAX11410_CMD_enum_t)0x0C, (uint32_t)0xF1), (uint8_t)1); // *mux_ctrl1=0xf1 drives current source from AIN1
+ tinyTester.FunctionCall_su_d_lu_Expect("MAX11410.RegWrite", fn_MAX11410_RegWrite, (MAX11410::MAX11410_CMD_enum_t)0x0C, (uint32_t)0xF1, /* expect: */ (uint8_t)1); // *mux_ctrl1=0xf1 drives current source from AIN1
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND
+
+ // @test group RES1KA0A1TOGNDMORE RegWrite(0x0A, 0x03) expect 1 // *source=0x03 idac_mode=100uA, 1k resistor 0.1V
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'RegWrite(0x0A, 0x03) expect 1'
+ // docTest_item['remarks'] = '*source=0x03 idac_mode=100uA, 1k resistor 0.1V'
+ // docTest_item['funcName'] = 'RegWrite'
+ // docTest_item['arglist'] = '0x0A, 0x03'
+ // docTest_item['expect-value'] = '1'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE RegWrite *source=0x03 idac_mode=100uA, 1k resistor 0.1V
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.RegWrite((MAX11410::MAX11410_CMD_enum_t)0x0A, (uint32_t)0x03), (uint8_t)1); // *source=0x03 idac_mode=100uA, 1k resistor 0.1V
+ tinyTester.FunctionCall_su_d_lu_Expect("MAX11410.RegWrite", fn_MAX11410_RegWrite, (MAX11410::MAX11410_CMD_enum_t)0x0A, (uint32_t)0x03, /* expect: */ (uint8_t)1); // *source=0x03 idac_mode=100uA, 1k resistor 0.1V
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGNDMORE tinyTester.print("idac_mode=100uA, 1k resistor 0.1V")
+ // docTest_item['actionType'] = 'print-string'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'tinyTester.print("idac_mode=100uA, 1k resistor 0.1V")'
+ // docTest_item['arglist'] = 'idac_mode=100uA, 1k resistor 0.1V'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE None
+ // print-string
+ // tinyTesterFuncName = "tinyTester.print"
+ // tinyTesterPrintStringLiteral = "idac_mode=100uA, 1k resistor 0.1V"
+ tinyTester.print("idac_mode=100uA, 1k resistor 0.1V");
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGNDMORE tinyTester.Wait_Output_Settling()
+ // docTest_item['actionType'] = 'call-tinytester-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'tinyTester.Wait_Output_Settling()'
+ // docTest_item['propName'] = 'Wait_Output_Settling'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE None
+ // call-tinytester-function
+ // tinyTesterFuncName = "tinyTester.Wait_Output_Settling"
+ // docTest_argList = ""
+ tinyTester.Wait_Output_Settling(); //
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGND_BAD Measure_Voltage(0,10) // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND_BAD'
+ // docTest_item['action'] = 'Measure_Voltage(0,10)'
+ // docTest_item['remarks'] = 'TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?'
+ // docTest_item['funcName'] = 'Measure_Voltage'
+ // docTest_item['arglist'] = '0,10'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND_BAD // group RES1KA0A1TOGND_BAD Measure_Voltage TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10), (double)None); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // tinyTester.FunctionCall_Expect("MAX11410.Measure_Voltage", fn_MAX11410_Measure_Voltage, (MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10, /* empty expect: */ (double)None); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND_BAD // group RES1KA0A1TOGND_BAD
+
+ // @test group RES1KA0A1TOGNDMORE Measure_Voltage(0,10) expect 0.1
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'Measure_Voltage(0,10) expect 0.1'
+ // docTest_item['funcName'] = 'Measure_Voltage'
+ // docTest_item['arglist'] = '0,10'
+ // docTest_item['expect-value'] = '0.1'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE Measure_Voltage
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10), (double)0.1); //
+ tinyTester.FunctionCall_f_d_d_Expect("MAX11410.Measure_Voltage", fn_MAX11410_Measure_Voltage, (MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10, /* expect: */ (double)0.1); //
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGNDMORE AINcode[0] expect (uint32_t)337731 within 33773 // idac_mode=100uA, 1k resistor 0.1V
+ // @test group RES1KA0A1TOGNDMORE RegWrite(0x0A, 0x0D) expect 1 // *source=0x0d idac_mode=800uA, 1k resistor 0.8V
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'RegWrite(0x0A, 0x0D) expect 1'
+ // docTest_item['remarks'] = '*source=0x0d idac_mode=800uA, 1k resistor 0.8V'
+ // docTest_item['funcName'] = 'RegWrite'
+ // docTest_item['arglist'] = '0x0A, 0x0D'
+ // docTest_item['expect-value'] = '1'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE RegWrite *source=0x0d idac_mode=800uA, 1k resistor 0.8V
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.RegWrite((MAX11410::MAX11410_CMD_enum_t)0x0A, (uint32_t)0x0D), (uint8_t)1); // *source=0x0d idac_mode=800uA, 1k resistor 0.8V
+ tinyTester.FunctionCall_su_d_lu_Expect("MAX11410.RegWrite", fn_MAX11410_RegWrite, (MAX11410::MAX11410_CMD_enum_t)0x0A, (uint32_t)0x0D, /* expect: */ (uint8_t)1); // *source=0x0d idac_mode=800uA, 1k resistor 0.8V
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGNDMORE tinyTester.print("idac_mode=800uA, 1k resistor 0.8V")
+ // docTest_item['actionType'] = 'print-string'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'tinyTester.print("idac_mode=800uA, 1k resistor 0.8V")'
+ // docTest_item['arglist'] = 'idac_mode=800uA, 1k resistor 0.8V'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE None
+ // print-string
+ // tinyTesterFuncName = "tinyTester.print"
+ // tinyTesterPrintStringLiteral = "idac_mode=800uA, 1k resistor 0.8V"
+ tinyTester.print("idac_mode=800uA, 1k resistor 0.8V");
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGNDMORE tinyTester.Wait_Output_Settling()
+ // docTest_item['actionType'] = 'call-tinytester-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'tinyTester.Wait_Output_Settling()'
+ // docTest_item['propName'] = 'Wait_Output_Settling'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE None
+ // call-tinytester-function
+ // tinyTesterFuncName = "tinyTester.Wait_Output_Settling"
+ // docTest_argList = ""
+ tinyTester.Wait_Output_Settling(); //
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGND_BAD Measure_Voltage(0,10) // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND_BAD'
+ // docTest_item['action'] = 'Measure_Voltage(0,10)'
+ // docTest_item['remarks'] = 'TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?'
+ // docTest_item['funcName'] = 'Measure_Voltage'
+ // docTest_item['arglist'] = '0,10'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND_BAD // group RES1KA0A1TOGND_BAD Measure_Voltage TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10), (double)None); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // tinyTester.FunctionCall_Expect("MAX11410.Measure_Voltage", fn_MAX11410_Measure_Voltage, (MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10, /* empty expect: */ (double)None); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND_BAD // group RES1KA0A1TOGND_BAD
+
+ // @test group RES1KA0A1TOGNDMORE Measure_Voltage(0,10) expect 0.8
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'Measure_Voltage(0,10) expect 0.8'
+ // docTest_item['funcName'] = 'Measure_Voltage'
+ // docTest_item['arglist'] = '0,10'
+ // docTest_item['expect-value'] = '0.8'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE Measure_Voltage
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10), (double)0.8); //
+ tinyTester.FunctionCall_f_d_d_Expect("MAX11410.Measure_Voltage", fn_MAX11410_Measure_Voltage, (MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10, /* expect: */ (double)0.8); //
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGNDMORE AINcode[0] expect (uint32_t)2724467 within 33773 // idac_mode=800uA, 1k resistor 0.8V
+ // @test group RES1KA0A1TOGND RegWrite(0x0A, 0x0B) expect 1 // *source=0x0b idac_mode=400uA, 1k resistor 0.4V
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND'
+ // docTest_item['action'] = 'RegWrite(0x0A, 0x0B) expect 1'
+ // docTest_item['remarks'] = '*source=0x0b idac_mode=400uA, 1k resistor 0.4V'
+ // docTest_item['funcName'] = 'RegWrite'
+ // docTest_item['arglist'] = '0x0A, 0x0B'
+ // docTest_item['expect-value'] = '1'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND RegWrite *source=0x0b idac_mode=400uA, 1k resistor 0.4V
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.RegWrite((MAX11410::MAX11410_CMD_enum_t)0x0A, (uint32_t)0x0B), (uint8_t)1); // *source=0x0b idac_mode=400uA, 1k resistor 0.4V
+ tinyTester.FunctionCall_su_d_lu_Expect("MAX11410.RegWrite", fn_MAX11410_RegWrite, (MAX11410::MAX11410_CMD_enum_t)0x0A, (uint32_t)0x0B, /* expect: */ (uint8_t)1); // *source=0x0b idac_mode=400uA, 1k resistor 0.4V
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND
+
+ // @test group RES1KA0A1TOGNDMORE tinyTester.print("idac_mode=400uA, 1k resistor 0.4V")
+ // docTest_item['actionType'] = 'print-string'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGNDMORE'
+ // docTest_item['action'] = 'tinyTester.print("idac_mode=400uA, 1k resistor 0.4V")'
+ // docTest_item['arglist'] = 'idac_mode=400uA, 1k resistor 0.4V'
+#if MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE None
+ // print-string
+ // tinyTesterFuncName = "tinyTester.print"
+ // tinyTesterPrintStringLiteral = "idac_mode=400uA, 1k resistor 0.4V"
+ tinyTester.print("idac_mode=400uA, 1k resistor 0.4V");
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGNDMORE // group RES1KA0A1TOGNDMORE
+
+ // @test group RES1KA0A1TOGND tinyTester.Wait_Output_Settling()
+ // docTest_item['actionType'] = 'call-tinytester-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND'
+ // docTest_item['action'] = 'tinyTester.Wait_Output_Settling()'
+ // docTest_item['propName'] = 'Wait_Output_Settling'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND None
+ // call-tinytester-function
+ // tinyTesterFuncName = "tinyTester.Wait_Output_Settling"
+ // docTest_argList = ""
+ tinyTester.Wait_Output_Settling(); //
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND
+
+ // @test group RES1KA0A1TOGND_BAD Measure_Voltage(0,10) // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND_BAD'
+ // docTest_item['action'] = 'Measure_Voltage(0,10)'
+ // docTest_item['remarks'] = 'TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?'
+ // docTest_item['funcName'] = 'Measure_Voltage'
+ // docTest_item['arglist'] = '0,10'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND_BAD // group RES1KA0A1TOGND_BAD Measure_Voltage TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10), (double)None); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ // tinyTester.FunctionCall_Expect("MAX11410.Measure_Voltage", fn_MAX11410_Measure_Voltage, (MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10, /* empty expect: */ (double)None); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+ g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10); // TODO1 #175 MAX11410 Self Test why does Measure_Voltage(0,10) without expect cause an mbed hard fault?
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND_BAD // group RES1KA0A1TOGND_BAD
+
+ // @test group RES1KA0A1TOGND Measure_Voltage(0,10) expect 0.4
+ // docTest_item['actionType'] = 'call-function'
+ // docTest_item['group-id-value'] = 'RES1KA0A1TOGND'
+ // docTest_item['action'] = 'Measure_Voltage(0,10) expect 0.4'
+ // docTest_item['funcName'] = 'Measure_Voltage'
+ // docTest_item['arglist'] = '0,10'
+ // docTest_item['expect-value'] = '0.4'
+#if MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND Measure_Voltage
+ // call-function
+ // ASSERT_EQ(g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10), (double)0.4); //
+ tinyTester.FunctionCall_f_d_d_Expect("MAX11410.Measure_Voltage", fn_MAX11410_Measure_Voltage, (MAX11410::MAX11410_AINP_SEL_enum_t)0, (MAX11410::MAX11410_AINN_SEL_enum_t)10, /* expect: */ (double)0.4); //
+#endif // MAX11410_SELFTEST_RES1KA0A1TOGND // group RES1KA0A1TOGND
+
+ // @test group RES1KA0A1TOGNDMORE AINcode[0] expect (uint32_t)1343163 within 33773 // idac_mode=400uA, 1k resistor 0.4V
// @test tinyTester.print("check filter register is writeable")
// docTest_item['actionType'] = 'print-string'
// docTest_item['action'] = 'tinyTester.print("check filter register is writeable")'
@@ -2122,7 +2421,7 @@
// docTest_item['expect-value'] = '1'
// call-function
// ASSERT_EQ(g_MAX11410_device.RegWrite((MAX11410::MAX11410_CMD_enum_t)0x08, (uint32_t)0x34), (uint8_t)1); //
- tinyTester.FunctionCall_Expect("MAX11410.RegWrite", fn_MAX11410_RegWrite, (MAX11410::MAX11410_CMD_enum_t)0x08, (uint32_t)0x34, /* expect: */ (uint8_t)1); //
+ tinyTester.FunctionCall_su_d_lu_Expect("MAX11410.RegWrite", fn_MAX11410_RegWrite, (MAX11410::MAX11410_CMD_enum_t)0x08, (uint32_t)0x34, /* expect: */ (uint8_t)1); //
// @test tinyTester.print("check filter register is readable")
// docTest_item['actionType'] = 'print-string'
@@ -2145,7 +2444,7 @@
{ // expect-buffer 0x34
uint32_t buffer = 1234; // expect-buffer initial value
//
- tinyTester.FunctionCall_i_pi_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)0x08, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x34); //
+ tinyTester.FunctionCall_su_d_plu_Expect("MAX11410.RegRead", fn_MAX11410_RegRead, (MAX11410::MAX11410_CMD_enum_t)0x08, &buffer, /* expect: */ (uint8_t)1, /* expect-buffer: */ 0x34); //
} // expect-buffer 0x34
// @test tinyTester.settle_time_msec = 250 // default 250
@@ -2249,7 +2548,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR Configure_CTRL_REF These tests require REF2 = 2.500V
// call-function
// ASSERT_EQ(g_MAX11410_device.Configure_CTRL_REF((uint8_t)2), (uint8_t)1); // These tests require REF2 = 2.500V
- tinyTester.FunctionCall_Expect("MAX11410.Configure_CTRL_REF", fn_MAX11410_Configure_CTRL_REF, (uint8_t)2, /* expect: */ (uint8_t)1); // These tests require REF2 = 2.500V
+ tinyTester.FunctionCall_su_su_Expect("MAX11410.Configure_CTRL_REF", fn_MAX11410_Configure_CTRL_REF, (uint8_t)2, /* expect: */ (uint8_t)1); // These tests require REF2 = 2.500V
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR Configure_PGA(0,0) expect 1 // These tests require PGA gain=1
@@ -2263,7 +2562,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR Configure_PGA These tests require PGA gain=1
// call-function
// ASSERT_EQ(g_MAX11410_device.Configure_PGA((uint8_t)0, (uint8_t)0), (uint8_t)1); // These tests require PGA gain=1
- tinyTester.FunctionCall_Expect("MAX11410.Configure_PGA", fn_MAX11410_Configure_PGA, (uint8_t)0, (uint8_t)0, /* expect: */ (uint8_t)1); // These tests require PGA gain=1
+ tinyTester.FunctionCall_su_su_su_Expect("MAX11410.Configure_PGA", fn_MAX11410_Configure_PGA, (uint8_t)0, (uint8_t)0, /* expect: */ (uint8_t)1); // These tests require PGA gain=1
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0xFFFFFF) expect 2.500 within 0.030 // Full Scale
@@ -2279,7 +2578,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0xFFFFFF), (double)2.500); // Full Scale
tinyTester.err_threshold = 0.030; // within 0.030
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xFFFFFF, /* expect: */ (double)2.500); // Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xFFFFFF, /* expect: */ (double)2.500); // Full Scale
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0xFFFFFE) expect 2.500 // Full Scale
@@ -2293,7 +2592,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar Full Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0xFFFFFE), (double)2.500); // Full Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xFFFFFE, /* expect: */ (double)2.500); // Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xFFFFFE, /* expect: */ (double)2.500); // Full Scale
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0xCCCCCC) expect 2.000 // Two Volts
@@ -2307,7 +2606,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar Two Volts
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0xCCCCCC), (double)2.000); // Two Volts
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xCCCCCC, /* expect: */ (double)2.000); // Two Volts
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xCCCCCC, /* expect: */ (double)2.000); // Two Volts
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0xC00000) expect 1.875 // 75% Scale
@@ -2321,7 +2620,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar 75% Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0xC00000), (double)1.875); // 75% Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xC00000, /* expect: */ (double)1.875); // 75% Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0xC00000, /* expect: */ (double)1.875); // 75% Scale
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x800000) expect 1.250 // Mid Scale
@@ -2335,7 +2634,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar Mid Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x800000), (double)1.250); // Mid Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x800000, /* expect: */ (double)1.250); // Mid Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x800000, /* expect: */ (double)1.250); // Mid Scale
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x666666) expect 1.000 // One Volt
@@ -2349,7 +2648,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar One Volt
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x666666), (double)1.000); // One Volt
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x666666, /* expect: */ (double)1.000); // One Volt
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x666666, /* expect: */ (double)1.000); // One Volt
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x400000) expect 0.625 // 25% Scale
@@ -2363,7 +2662,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar 25% Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x400000), (double)0.625); // 25% Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x400000, /* expect: */ (double)0.625); // 25% Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x400000, /* expect: */ (double)0.625); // 25% Scale
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x0A3D70) expect 0.100 // 100mV
@@ -2377,7 +2676,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar 100mV
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x0A3D70), (double)0.100); // 100mV
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x0A3D70, /* expect: */ (double)0.100); // 100mV
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x0A3D70, /* expect: */ (double)0.100); // 100mV
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000064) expect 0.000014901162 // 100 LSB
@@ -2391,7 +2690,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar 100 LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x000064), (double)0.000014901162); // 100 LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000064, /* expect: */ (double)0.000014901162); // 100 LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000064, /* expect: */ (double)0.000014901162); // 100 LSB
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x00000A) expect 0.0000014901162 // Ten LSB
@@ -2405,7 +2704,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar Ten LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x00000A), (double)0.0000014901162); // Ten LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x00000A, /* expect: */ (double)0.0000014901162); // Ten LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x00000A, /* expect: */ (double)0.0000014901162); // Ten LSB
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000003) expect 0.00000044703483 // Three LSB
@@ -2419,7 +2718,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar Three LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x000003), (double)0.00000044703483); // Three LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000003, /* expect: */ (double)0.00000044703483); // Three LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000003, /* expect: */ (double)0.00000044703483); // Three LSB
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000002) expect 0.00000029802326 // Two LSB
@@ -2433,7 +2732,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar Two LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x000002), (double)0.00000029802326); // Two LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000002, /* expect: */ (double)0.00000029802326); // Two LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000002, /* expect: */ (double)0.00000029802326); // Two LSB
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000001) expect 0.00000014901162 // One LSB
@@ -2447,7 +2746,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar One LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x000001), (double)0.00000014901162); // One LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000001, /* expect: */ (double)0.00000014901162); // One LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000001, /* expect: */ (double)0.00000014901162); // One LSB
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR VoltageOfCode_Unipolar(0x000000) expect 0.0 // Zero Scale
@@ -2461,7 +2760,7 @@
#if MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR VoltageOfCode_Unipolar Zero Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)0x000000), (double)0.0); // Zero Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000000, /* expect: */ (double)0.0); // Zero Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Unipolar", fn_MAX11410_VoltageOfCode_Unipolar, (uint32_t)0x000000, /* expect: */ (double)0.0); // Zero Scale
#endif // MAX11410_SELFTEST_UNIPOLAR // group UNIPOLAR
// @test group UNIPOLAR tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
@@ -2504,7 +2803,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB Configure_CTRL_REF These tests require REF2 = 2.500V
// call-function
// ASSERT_EQ(g_MAX11410_device.Configure_CTRL_REF((uint8_t)2), (uint8_t)1); // These tests require REF2 = 2.500V
- tinyTester.FunctionCall_Expect("MAX11410.Configure_CTRL_REF", fn_MAX11410_Configure_CTRL_REF, (uint8_t)2, /* expect: */ (uint8_t)1); // These tests require REF2 = 2.500V
+ tinyTester.FunctionCall_su_su_Expect("MAX11410.Configure_CTRL_REF", fn_MAX11410_Configure_CTRL_REF, (uint8_t)2, /* expect: */ (uint8_t)1); // These tests require REF2 = 2.500V
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB Configure_PGA(0,0) expect 1 // These tests require PGA gain=1
@@ -2518,7 +2817,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB Configure_PGA These tests require PGA gain=1
// call-function
// ASSERT_EQ(g_MAX11410_device.Configure_PGA((uint8_t)0, (uint8_t)0), (uint8_t)1); // These tests require PGA gain=1
- tinyTester.FunctionCall_Expect("MAX11410.Configure_PGA", fn_MAX11410_Configure_PGA, (uint8_t)0, (uint8_t)0, /* expect: */ (uint8_t)1); // These tests require PGA gain=1
+ tinyTester.FunctionCall_su_su_su_Expect("MAX11410.Configure_PGA", fn_MAX11410_Configure_PGA, (uint8_t)0, (uint8_t)0, /* expect: */ (uint8_t)1); // These tests require PGA gain=1
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xFFFFFF) expect 2.5 within 0.030 // Full Scale
@@ -2534,7 +2833,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0xFFFFFF), (double)2.5); // Full Scale
tinyTester.err_threshold = 0.030; // within 0.030
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0xFFFFFF, /* expect: */ (double)2.5); // Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0xFFFFFF, /* expect: */ (double)2.5); // Full Scale
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xFFFFFE) expect 2.5 // Full Scale
@@ -2548,7 +2847,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Full Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0xFFFFFE), (double)2.5); // Full Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0xFFFFFE, /* expect: */ (double)2.5); // Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0xFFFFFE, /* expect: */ (double)2.5); // Full Scale
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0xC00000) expect 1.25 // Mid Scale
@@ -2562,7 +2861,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Mid Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0xC00000), (double)1.25); // Mid Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0xC00000, /* expect: */ (double)1.25); // Mid Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0xC00000, /* expect: */ (double)1.25); // Mid Scale
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800003) expect 0.00000894069671 // Three LSB
@@ -2576,7 +2875,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Three LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x800003), (double)0.00000894069671); // Three LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800003, /* expect: */ (double)0.00000894069671); // Three LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800003, /* expect: */ (double)0.00000894069671); // Three LSB
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800002) expect 0.00000596046447 // Two LSB
@@ -2590,7 +2889,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Two LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x800002), (double)0.00000596046447); // Two LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800002, /* expect: */ (double)0.00000596046447); // Two LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800002, /* expect: */ (double)0.00000596046447); // Two LSB
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800001) expect 0.0000029802326 // One LSB
@@ -2604,7 +2903,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary One LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x800001), (double)0.0000029802326); // One LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800001, /* expect: */ (double)0.0000029802326); // One LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800001, /* expect: */ (double)0.0000029802326); // One LSB
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x800000) expect 0.0 // Zero Scale
@@ -2618,7 +2917,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Zero Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x800000), (double)0.0); // Zero Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800000, /* expect: */ (double)0.0); // Zero Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x800000, /* expect: */ (double)0.0); // Zero Scale
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFF) expect -0.0000029802326 // Negative One LSB
@@ -2632,7 +2931,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Negative One LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x7FFFFF), (double)-0.0000029802326); // Negative One LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x7FFFFF, /* expect: */ (double)-0.0000029802326); // Negative One LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x7FFFFF, /* expect: */ (double)-0.0000029802326); // Negative One LSB
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFE) expect -0.0000059604644 // Negative Two LSB
@@ -2646,7 +2945,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Negative Two LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x7FFFFE), (double)-0.0000059604644); // Negative Two LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x7FFFFE, /* expect: */ (double)-0.0000059604644); // Negative Two LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x7FFFFE, /* expect: */ (double)-0.0000059604644); // Negative Two LSB
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x7FFFFD) expect -0.0000089406967 // Negative Three LSB
@@ -2660,7 +2959,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Negative Three LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x7FFFFD), (double)-0.0000089406967); // Negative Three LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x7FFFFD, /* expect: */ (double)-0.0000089406967); // Negative Three LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x7FFFFD, /* expect: */ (double)-0.0000089406967); // Negative Three LSB
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x400000) expect -1.25 // Negative Mid Scale
@@ -2674,7 +2973,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Negative Mid Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x400000), (double)-1.25); // Negative Mid Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x400000, /* expect: */ (double)-1.25); // Negative Mid Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x400000, /* expect: */ (double)-1.25); // Negative Mid Scale
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x000001) expect -2.5 // Negative Full Scale
@@ -2688,7 +2987,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Negative Full Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x000001), (double)-2.5); // Negative Full Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x000001, /* expect: */ (double)-2.5); // Negative Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x000001, /* expect: */ (double)-2.5); // Negative Full Scale
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB VoltageOfCode_Bipolar_OffsetBinary(0x000000) expect -2.5 // Negative Full Scale
@@ -2702,7 +3001,7 @@
#if MAX11410_SELFTEST_BIPOB // group BIPOB VoltageOfCode_Bipolar_OffsetBinary Negative Full Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)0x000000), (double)-2.5); // Negative Full Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x000000, /* expect: */ (double)-2.5); // Negative Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_OffsetBinary", fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary, (uint32_t)0x000000, /* expect: */ (double)-2.5); // Negative Full Scale
#endif // MAX11410_SELFTEST_BIPOB // group BIPOB
// @test group BIPOB tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
@@ -2745,7 +3044,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C Configure_CTRL_REF These tests require REF2 = 2.500V
// call-function
// ASSERT_EQ(g_MAX11410_device.Configure_CTRL_REF((uint8_t)2), (uint8_t)1); // These tests require REF2 = 2.500V
- tinyTester.FunctionCall_Expect("MAX11410.Configure_CTRL_REF", fn_MAX11410_Configure_CTRL_REF, (uint8_t)2, /* expect: */ (uint8_t)1); // These tests require REF2 = 2.500V
+ tinyTester.FunctionCall_su_su_Expect("MAX11410.Configure_CTRL_REF", fn_MAX11410_Configure_CTRL_REF, (uint8_t)2, /* expect: */ (uint8_t)1); // These tests require REF2 = 2.500V
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C Configure_PGA(0,0) expect 1 // These tests require PGA gain=1
@@ -2759,7 +3058,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C Configure_PGA These tests require PGA gain=1
// call-function
// ASSERT_EQ(g_MAX11410_device.Configure_PGA((uint8_t)0, (uint8_t)0), (uint8_t)1); // These tests require PGA gain=1
- tinyTester.FunctionCall_Expect("MAX11410.Configure_PGA", fn_MAX11410_Configure_PGA, (uint8_t)0, (uint8_t)0, /* expect: */ (uint8_t)1); // These tests require PGA gain=1
+ tinyTester.FunctionCall_su_su_su_Expect("MAX11410.Configure_PGA", fn_MAX11410_Configure_PGA, (uint8_t)0, (uint8_t)0, /* expect: */ (uint8_t)1); // These tests require PGA gain=1
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x7FFFFF) expect 2.500 within 0.030 // Full Scale
@@ -2775,7 +3074,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x7FFFFF), (double)2.500); // Full Scale
tinyTester.err_threshold = 0.030; // within 0.030
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x7FFFFF, /* expect: */ (double)2.500); // Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x7FFFFF, /* expect: */ (double)2.500); // Full Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x7FFFFE) expect 2.500 // Full Scale
@@ -2789,7 +3088,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Full Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x7FFFFE), (double)2.500); // Full Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x7FFFFE, /* expect: */ (double)2.500); // Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x7FFFFE, /* expect: */ (double)2.500); // Full Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x666666) expect 2.000 // Two Volts
@@ -2803,7 +3102,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Two Volts
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x666666), (double)2.000); // Two Volts
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x666666, /* expect: */ (double)2.000); // Two Volts
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x666666, /* expect: */ (double)2.000); // Two Volts
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x600000) expect 1.875 // 75% Scale
@@ -2817,7 +3116,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement 75% Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x600000), (double)1.875); // 75% Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x600000, /* expect: */ (double)1.875); // 75% Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x600000, /* expect: */ (double)1.875); // 75% Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x400000) expect 1.250 // Mid Scale
@@ -2831,7 +3130,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Mid Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x400000), (double)1.250); // Mid Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x400000, /* expect: */ (double)1.250); // Mid Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x400000, /* expect: */ (double)1.250); // Mid Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x333333) expect 1.000 // One Volt
@@ -2845,7 +3144,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement One Volt
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x333333), (double)1.000); // One Volt
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x333333, /* expect: */ (double)1.000); // One Volt
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x333333, /* expect: */ (double)1.000); // One Volt
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x200000) expect 0.625 // 25% Scale
@@ -2859,7 +3158,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement 25% Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x200000), (double)0.625); // 25% Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x200000, /* expect: */ (double)0.625); // 25% Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x200000, /* expect: */ (double)0.625); // 25% Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x051eb8) expect 0.100 // 100mV
@@ -2873,7 +3172,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement 100mV
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x051eb8), (double)0.100); // 100mV
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x051eb8, /* expect: */ (double)0.100); // 100mV
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x051eb8, /* expect: */ (double)0.100); // 100mV
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000003) expect 0.00000894069671 // Three LSB
@@ -2887,7 +3186,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Three LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x000003), (double)0.00000894069671); // Three LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000003, /* expect: */ (double)0.00000894069671); // Three LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000003, /* expect: */ (double)0.00000894069671); // Three LSB
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000002) expect 0.00000596046447 // Two LSB
@@ -2901,7 +3200,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Two LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x000002), (double)0.00000596046447); // Two LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000002, /* expect: */ (double)0.00000596046447); // Two LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000002, /* expect: */ (double)0.00000596046447); // Two LSB
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000001) expect 0.0000029802326 // One LSB
@@ -2915,7 +3214,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement One LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x000001), (double)0.0000029802326); // One LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000001, /* expect: */ (double)0.0000029802326); // One LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000001, /* expect: */ (double)0.0000029802326); // One LSB
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x000000) expect 0.0 // Zero Scale
@@ -2929,7 +3228,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Zero Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x000000), (double)0.0); // Zero Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000000, /* expect: */ (double)0.0); // Zero Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x000000, /* expect: */ (double)0.0); // Zero Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFF) expect -0.0000029802326 // Negative One LSB
@@ -2943,7 +3242,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative One LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xFFFFFF), (double)-0.0000029802326); // Negative One LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFFFFFF, /* expect: */ (double)-0.0000029802326); // Negative One LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFFFFFF, /* expect: */ (double)-0.0000029802326); // Negative One LSB
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFE) expect -0.0000059604644 // Negative Two LSB
@@ -2957,7 +3256,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative Two LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xFFFFFE), (double)-0.0000059604644); // Negative Two LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFFFFFE, /* expect: */ (double)-0.0000059604644); // Negative Two LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFFFFFE, /* expect: */ (double)-0.0000059604644); // Negative Two LSB
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFFFFFD) expect -0.0000089406967 // Negative Three LSB
@@ -2971,7 +3270,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative Three LSB
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xFFFFFD), (double)-0.0000089406967); // Negative Three LSB
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFFFFFD, /* expect: */ (double)-0.0000089406967); // Negative Three LSB
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFFFFFD, /* expect: */ (double)-0.0000089406967); // Negative Three LSB
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xFAE148) expect -0.100 // Negative 100mV
@@ -2985,7 +3284,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative 100mV
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xFAE148), (double)-0.100); // Negative 100mV
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFAE148, /* expect: */ (double)-0.100); // Negative 100mV
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xFAE148, /* expect: */ (double)-0.100); // Negative 100mV
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xE00000) expect -0.625 // Negative 25% Scale
@@ -2999,7 +3298,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative 25% Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xE00000), (double)-0.625); // Negative 25% Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xE00000, /* expect: */ (double)-0.625); // Negative 25% Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xE00000, /* expect: */ (double)-0.625); // Negative 25% Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xCCCCCD) expect -1.000 // Negative One Volt
@@ -3013,7 +3312,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative One Volt
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xCCCCCD), (double)-1.000); // Negative One Volt
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xCCCCCD, /* expect: */ (double)-1.000); // Negative One Volt
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xCCCCCD, /* expect: */ (double)-1.000); // Negative One Volt
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xC00000) expect -1.250 // Negative Mid Scale
@@ -3027,7 +3326,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative Mid Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xC00000), (double)-1.250); // Negative Mid Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xC00000, /* expect: */ (double)-1.250); // Negative Mid Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xC00000, /* expect: */ (double)-1.250); // Negative Mid Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0xA00000) expect -1.875 // Negative 75% Scale
@@ -3041,7 +3340,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative 75% Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0xA00000), (double)-1.875); // Negative 75% Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xA00000, /* expect: */ (double)-1.875); // Negative 75% Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0xA00000, /* expect: */ (double)-1.875); // Negative 75% Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x99999A) expect -2.000 // Negative Two Volts
@@ -3055,7 +3354,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative Two Volts
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x99999A), (double)-2.000); // Negative Two Volts
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x99999A, /* expect: */ (double)-2.000); // Negative Two Volts
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x99999A, /* expect: */ (double)-2.000); // Negative Two Volts
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x800001) expect -2.500 // Negative Full Scale
@@ -3069,7 +3368,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative Full Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x800001), (double)-2.500); // Negative Full Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x800001, /* expect: */ (double)-2.500); // Negative Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x800001, /* expect: */ (double)-2.500); // Negative Full Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C VoltageOfCode_Bipolar_2sComplement(0x800000) expect -2.500 // Negative Full Scale
@@ -3083,7 +3382,7 @@
#if MAX11410_SELFTEST_BIP2C // group BIP2C VoltageOfCode_Bipolar_2sComplement Negative Full Scale
// call-function
// ASSERT_EQ(g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)0x800000), (double)-2.500); // Negative Full Scale
- tinyTester.FunctionCall_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x800000, /* expect: */ (double)-2.500); // Negative Full Scale
+ tinyTester.FunctionCall_f_lu_Expect("MAX11410.VoltageOfCode_Bipolar_2sComplement", fn_MAX11410_VoltageOfCode_Bipolar_2sComplement, (uint32_t)0x800000, /* expect: */ (double)-2.500); // Negative Full Scale
#endif // MAX11410_SELFTEST_BIP2C // group BIP2C
// @test group BIP2C tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
@@ -3128,7 +3427,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT1000((double)842.94), (double)-40.0); // PT-1000 RTD at -40C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)842.94, /* expect: */ (double)-40.0); // PT-1000 RTD at -40C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)842.94, /* expect: */ (double)-40.0); // PT-1000 RTD at -40C
#endif // MAX11410_SELFTEST_RTD_PT1000 // group RTD_PT1000
// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1000.0) expect 0.0 within 0.1 // PT-1000 RTD at 0C
@@ -3144,7 +3443,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT1000((double)1000.0), (double)0.0); // PT-1000 RTD at 0C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1000.0, /* expect: */ (double)0.0); // PT-1000 RTD at 0C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1000.0, /* expect: */ (double)0.0); // PT-1000 RTD at 0C
#endif // MAX11410_SELFTEST_RTD_PT1000 // group RTD_PT1000
// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1097.3) expect 25.0 within 0.1 // PT-1000 RTD at 25C
@@ -3160,7 +3459,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT1000((double)1097.3), (double)25.0); // PT-1000 RTD at 25C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1097.3, /* expect: */ (double)25.0); // PT-1000 RTD at 25C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1097.3, /* expect: */ (double)25.0); // PT-1000 RTD at 25C
#endif // MAX11410_SELFTEST_RTD_PT1000 // group RTD_PT1000
// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1328.1) expect 85.0 within 0.1 // PT-1000 RTD at 85C
@@ -3176,7 +3475,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT1000((double)1328.1), (double)85.0); // PT-1000 RTD at 85C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1328.1, /* expect: */ (double)85.0); // PT-1000 RTD at 85C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1328.1, /* expect: */ (double)85.0); // PT-1000 RTD at 85C
#endif // MAX11410_SELFTEST_RTD_PT1000 // group RTD_PT1000
// @test group RTD_PT1000 TemperatureOfRTD_PT1000(1479.5) expect 125.0 within 0.1 // PT-1000 RTD at 125C
@@ -3192,7 +3491,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT1000((double)1479.5), (double)125.0); // PT-1000 RTD at 125C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1479.5, /* expect: */ (double)125.0); // PT-1000 RTD at 125C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT1000", fn_MAX11410_TemperatureOfRTD_PT1000, (double)1479.5, /* expect: */ (double)125.0); // PT-1000 RTD at 125C
#endif // MAX11410_SELFTEST_RTD_PT1000 // group RTD_PT1000
// @test group RTD_PT1000 tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
@@ -3237,7 +3536,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT100((double)84.294), (double)-40.0); // PT-100 RTD at -40C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)84.294, /* expect: */ (double)-40.0); // PT-100 RTD at -40C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)84.294, /* expect: */ (double)-40.0); // PT-100 RTD at -40C
#endif // MAX11410_SELFTEST_RTD_PT100 // group RTD_PT100
// @test group RTD_PT100 TemperatureOfRTD_PT100(100.00) expect 0.0 within 0.1 // PT-100 RTD at 0C
@@ -3253,7 +3552,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT100((double)100.00), (double)0.0); // PT-100 RTD at 0C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)100.00, /* expect: */ (double)0.0); // PT-100 RTD at 0C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)100.00, /* expect: */ (double)0.0); // PT-100 RTD at 0C
#endif // MAX11410_SELFTEST_RTD_PT100 // group RTD_PT100
// @test group RTD_PT100 TemperatureOfRTD_PT100(109.73) expect 25.0 within 0.1 // PT-100 RTD at 25C
@@ -3269,7 +3568,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT100((double)109.73), (double)25.0); // PT-100 RTD at 25C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)109.73, /* expect: */ (double)25.0); // PT-100 RTD at 25C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)109.73, /* expect: */ (double)25.0); // PT-100 RTD at 25C
#endif // MAX11410_SELFTEST_RTD_PT100 // group RTD_PT100
// @test group RTD_PT100 TemperatureOfRTD_PT100(132.81) expect 85.0 within 0.1 // PT-100 RTD at 85C
@@ -3285,7 +3584,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT100((double)132.81), (double)85.0); // PT-100 RTD at 85C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)132.81, /* expect: */ (double)85.0); // PT-100 RTD at 85C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)132.81, /* expect: */ (double)85.0); // PT-100 RTD at 85C
#endif // MAX11410_SELFTEST_RTD_PT100 // group RTD_PT100
// @test group RTD_PT100 TemperatureOfRTD_PT100(147.95) expect 125.0 within 0.1 // PT-100 RTD at 125C
@@ -3301,7 +3600,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD_PT100((double)147.95), (double)125.0); // PT-100 RTD at 125C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)147.95, /* expect: */ (double)125.0); // PT-100 RTD at 125C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD_PT100", fn_MAX11410_TemperatureOfRTD_PT100, (double)147.95, /* expect: */ (double)125.0); // PT-100 RTD at 125C
#endif // MAX11410_SELFTEST_RTD_PT100 // group RTD_PT100
// @test group RTD_PT100 tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
@@ -3346,7 +3645,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)84.294), (double)-40.0); // PT-100 RTD at -40C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)84.294, /* expect: */ (double)-40.0); // PT-100 RTD at -40C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)84.294, /* expect: */ (double)-40.0); // PT-100 RTD at -40C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(100.00) expect 0.0 within 0.1 // PT-100 RTD at 0C
@@ -3362,7 +3661,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)100.00), (double)0.0); // PT-100 RTD at 0C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)100.00, /* expect: */ (double)0.0); // PT-100 RTD at 0C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)100.00, /* expect: */ (double)0.0); // PT-100 RTD at 0C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(109.73) expect 25.0 within 0.1 // PT-100 RTD at 25C
@@ -3378,7 +3677,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)109.73), (double)25.0); // PT-100 RTD at 25C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)109.73, /* expect: */ (double)25.0); // PT-100 RTD at 25C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)109.73, /* expect: */ (double)25.0); // PT-100 RTD at 25C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(132.81) expect 85.0 within 0.1 // PT-100 RTD at 85C
@@ -3394,7 +3693,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)132.81), (double)85.0); // PT-100 RTD at 85C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)132.81, /* expect: */ (double)85.0); // PT-100 RTD at 85C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)132.81, /* expect: */ (double)85.0); // PT-100 RTD at 85C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(147.95) expect 125.0 within 0.1 // PT-100 RTD at 125C
@@ -3410,7 +3709,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)147.95), (double)125.0); // PT-100 RTD at 125C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)147.95, /* expect: */ (double)125.0); // PT-100 RTD at 125C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)147.95, /* expect: */ (double)125.0); // PT-100 RTD at 125C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(842.94) expect -40.0 within 0.1 // PT-1000 RTD at -40C
@@ -3426,7 +3725,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)842.94), (double)-40.0); // PT-1000 RTD at -40C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)842.94, /* expect: */ (double)-40.0); // PT-1000 RTD at -40C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)842.94, /* expect: */ (double)-40.0); // PT-1000 RTD at -40C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(1000.0) expect 0.0 within 0.1 // PT-1000 RTD at 0C
@@ -3442,7 +3741,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)1000.0), (double)0.0); // PT-1000 RTD at 0C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1000.0, /* expect: */ (double)0.0); // PT-1000 RTD at 0C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1000.0, /* expect: */ (double)0.0); // PT-1000 RTD at 0C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(1097.3) expect 25.0 within 0.1 // PT-1000 RTD at 25C
@@ -3458,7 +3757,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)1097.3), (double)25.0); // PT-1000 RTD at 25C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1097.3, /* expect: */ (double)25.0); // PT-1000 RTD at 25C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1097.3, /* expect: */ (double)25.0); // PT-1000 RTD at 25C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(1328.1) expect 85.0 within 0.1 // PT-1000 RTD at 85C
@@ -3474,7 +3773,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)1328.1), (double)85.0); // PT-1000 RTD at 85C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1328.1, /* expect: */ (double)85.0); // PT-1000 RTD at 85C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1328.1, /* expect: */ (double)85.0); // PT-1000 RTD at 85C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD TemperatureOfRTD(1479.5) expect 125.0 within 0.1 // PT-1000 RTD at 125C
@@ -3490,7 +3789,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfRTD((double)1479.5), (double)125.0); // PT-1000 RTD at 125C
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1479.5, /* expect: */ (double)125.0); // PT-1000 RTD at 125C
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfRTD", fn_MAX11410_TemperatureOfRTD, (double)1479.5, /* expect: */ (double)125.0); // PT-1000 RTD at 125C
#endif // MAX11410_SELFTEST_RTD // group RTD
// @test group RTD tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
@@ -3536,7 +3835,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.000e-3), (double)0.0); // TC_TypeK at 0C = 0.000mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.000e-3, /* expect: */ (double)0.0); // TC_TypeK at 0C = 0.000mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.000e-3, /* expect: */ (double)0.0); // TC_TypeK at 0C = 0.000mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(0.039e-3) expect 1.0 within 0.1 // TC_TypeK at 1C = 0.039mV
@@ -3552,7 +3851,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.039e-3), (double)1.0); // TC_TypeK at 1C = 0.039mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.039e-3, /* expect: */ (double)1.0); // TC_TypeK at 1C = 0.039mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.039e-3, /* expect: */ (double)1.0); // TC_TypeK at 1C = 0.039mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(0.079e-3) expect 2.0 within 0.1 // TC_TypeK at 2C = 0.079mV
@@ -3568,7 +3867,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.079e-3), (double)2.0); // TC_TypeK at 2C = 0.079mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.079e-3, /* expect: */ (double)2.0); // TC_TypeK at 2C = 0.079mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.079e-3, /* expect: */ (double)2.0); // TC_TypeK at 2C = 0.079mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(0.119e-3) expect 3.0 within 0.1 // TC_TypeK at 3C = 0.119mV
@@ -3584,7 +3883,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.119e-3), (double)3.0); // TC_TypeK at 3C = 0.119mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.119e-3, /* expect: */ (double)3.0); // TC_TypeK at 3C = 0.119mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.119e-3, /* expect: */ (double)3.0); // TC_TypeK at 3C = 0.119mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_2 TemperatureOfTC_TypeK(0.158e-3) expect 4.0 within 0.1 // TC_TypeK at 4C = 0.158mV
@@ -3600,7 +3899,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.158e-3), (double)4.0); // TC_TypeK at 4C = 0.158mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.158e-3, /* expect: */ (double)4.0); // TC_TypeK at 4C = 0.158mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.158e-3, /* expect: */ (double)4.0); // TC_TypeK at 4C = 0.158mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(0.198e-3) expect 5.0 within 0.1 // TC_TypeK at 5C = 0.198mV
@@ -3616,7 +3915,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.198e-3), (double)5.0); // TC_TypeK at 5C = 0.198mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.198e-3, /* expect: */ (double)5.0); // TC_TypeK at 5C = 0.198mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.198e-3, /* expect: */ (double)5.0); // TC_TypeK at 5C = 0.198mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(0.238e-3) expect 6.0 within 0.1 // TC_TypeK at 6C = 0.238mV
@@ -3632,7 +3931,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.238e-3), (double)6.0); // TC_TypeK at 6C = 0.238mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.238e-3, /* expect: */ (double)6.0); // TC_TypeK at 6C = 0.238mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.238e-3, /* expect: */ (double)6.0); // TC_TypeK at 6C = 0.238mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(0.2775e-3) expect 7.0 within 0.1 // TC_TypeK at 7C = 0.2775mV
@@ -3648,7 +3947,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.2775e-3), (double)7.0); // TC_TypeK at 7C = 0.2775mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.2775e-3, /* expect: */ (double)7.0); // TC_TypeK at 7C = 0.2775mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.2775e-3, /* expect: */ (double)7.0); // TC_TypeK at 7C = 0.2775mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(0.317e-3) expect 8.0 within 0.1 // TC_TypeK at 8C = 0.317mV
@@ -3664,7 +3963,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.317e-3), (double)8.0); // TC_TypeK at 8C = 0.317mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.317e-3, /* expect: */ (double)8.0); // TC_TypeK at 8C = 0.317mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.317e-3, /* expect: */ (double)8.0); // TC_TypeK at 8C = 0.317mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(0.357e-3) expect 9.0 within 0.1 // TC_TypeK at 9C = 0.357mV
@@ -3680,7 +3979,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.357e-3), (double)9.0); // TC_TypeK at 9C = 0.357mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.357e-3, /* expect: */ (double)9.0); // TC_TypeK at 9C = 0.357mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.357e-3, /* expect: */ (double)9.0); // TC_TypeK at 9C = 0.357mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_1 TemperatureOfTC_TypeK(0.397e-3) expect 10.0 within 0.1 // TC_TypeK at 10C = 0.397mV
@@ -3696,7 +3995,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.397e-3), (double)10.0); // TC_TypeK at 10C = 0.397mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.397e-3, /* expect: */ (double)10.0); // TC_TypeK at 10C = 0.397mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.397e-3, /* expect: */ (double)10.0); // TC_TypeK at 10C = 0.397mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(0.798e-3) expect 20.0 within 0.1 // TC_TypeK at 20C = 0.798mV
@@ -3712,7 +4011,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)0.798e-3), (double)20.0); // TC_TypeK at 20C = 0.798mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.798e-3, /* expect: */ (double)20.0); // TC_TypeK at 20C = 0.798mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)0.798e-3, /* expect: */ (double)20.0); // TC_TypeK at 20C = 0.798mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(1.081e-3) expect 27.0 within 0.1 // TC_TypeK at 27C = 1.081mV
@@ -3728,7 +4027,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)1.081e-3), (double)27.0); // TC_TypeK at 27C = 1.081mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)1.081e-3, /* expect: */ (double)27.0); // TC_TypeK at 27C = 1.081mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)1.081e-3, /* expect: */ (double)27.0); // TC_TypeK at 27C = 1.081mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(1.203e-3) expect 30.0 within 0.1 // TC_TypeK at 30C = 1.203mV
@@ -3744,7 +4043,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)1.203e-3), (double)30.0); // TC_TypeK at 30C = 1.203mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)1.203e-3, /* expect: */ (double)30.0); // TC_TypeK at 30C = 1.203mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)1.203e-3, /* expect: */ (double)30.0); // TC_TypeK at 30C = 1.203mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(1.612e-3) expect 40.0 within 0.1 // TC_TypeK at 40C = 1.612mV
@@ -3760,7 +4059,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)1.612e-3), (double)40.0); // TC_TypeK at 40C = 1.612mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)1.612e-3, /* expect: */ (double)40.0); // TC_TypeK at 40C = 1.612mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)1.612e-3, /* expect: */ (double)40.0); // TC_TypeK at 40C = 1.612mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(2.023e-3) expect 50.0 within 0.1 // TC_TypeK at 50C = 2.023mV
@@ -3776,7 +4075,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)2.023e-3), (double)50.0); // TC_TypeK at 50C = 2.023mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)2.023e-3, /* expect: */ (double)50.0); // TC_TypeK at 50C = 2.023mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)2.023e-3, /* expect: */ (double)50.0); // TC_TypeK at 50C = 2.023mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(2.436e-3) expect 60.0 within 0.1 // TC_TypeK at 60C = 2.436mV
@@ -3792,7 +4091,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)2.436e-3), (double)60.0); // TC_TypeK at 60C = 2.436mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)2.436e-3, /* expect: */ (double)60.0); // TC_TypeK at 60C = 2.436mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)2.436e-3, /* expect: */ (double)60.0); // TC_TypeK at 60C = 2.436mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(2.851e-3) expect 70.0 within 0.1 // TC_TypeK at 70C = 2.851mV
@@ -3808,7 +4107,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)2.851e-3), (double)70.0); // TC_TypeK at 70C = 2.851mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)2.851e-3, /* expect: */ (double)70.0); // TC_TypeK at 70C = 2.851mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)2.851e-3, /* expect: */ (double)70.0); // TC_TypeK at 70C = 2.851mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(3.267e-3) expect 80.0 within 0.1 // TC_TypeK at 80C = 3.267mV
@@ -3824,7 +4123,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)3.267e-3), (double)80.0); // TC_TypeK at 80C = 3.267mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)3.267e-3, /* expect: */ (double)80.0); // TC_TypeK at 80C = 3.267mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)3.267e-3, /* expect: */ (double)80.0); // TC_TypeK at 80C = 3.267mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(3.682e-3) expect 90.0 within 0.1 // TC_TypeK at 90C = 3.682mV
@@ -3840,7 +4139,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)3.682e-3), (double)90.0); // TC_TypeK at 90C = 3.682mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)3.682e-3, /* expect: */ (double)90.0); // TC_TypeK at 90C = 3.682mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)3.682e-3, /* expect: */ (double)90.0); // TC_TypeK at 90C = 3.682mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(4.096e-3) expect 100.0 within 0.1 // TC_TypeK at 100C = 4.096mV
@@ -3856,7 +4155,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)4.096e-3), (double)100.0); // TC_TypeK at 100C = 4.096mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)4.096e-3, /* expect: */ (double)100.0); // TC_TypeK at 100C = 4.096mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)4.096e-3, /* expect: */ (double)100.0); // TC_TypeK at 100C = 4.096mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_2 TemperatureOfTC_TypeK(4.509e-3) expect 110.0 within 0.1 // TC_TypeK at 110C = 4.509mV
@@ -3872,7 +4171,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)4.509e-3), (double)110.0); // TC_TypeK at 110C = 4.509mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)4.509e-3, /* expect: */ (double)110.0); // TC_TypeK at 110C = 4.509mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)4.509e-3, /* expect: */ (double)110.0); // TC_TypeK at 110C = 4.509mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(4.920e-3) expect 120.0 within 0.1 // TC_TypeK at 120C = 4.920mV
@@ -3888,7 +4187,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)4.920e-3), (double)120.0); // TC_TypeK at 120C = 4.920mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)4.920e-3, /* expect: */ (double)120.0); // TC_TypeK at 120C = 4.920mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)4.920e-3, /* expect: */ (double)120.0); // TC_TypeK at 120C = 4.920mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(5.328e-3) expect 130.0 within 0.1 // TC_TypeK at 130C = 5.328mV
@@ -3904,7 +4203,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)5.328e-3), (double)130.0); // TC_TypeK at 130C = 5.328mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)5.328e-3, /* expect: */ (double)130.0); // TC_TypeK at 130C = 5.328mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)5.328e-3, /* expect: */ (double)130.0); // TC_TypeK at 130C = 5.328mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(5.735e-3) expect 140.0 within 0.1 // TC_TypeK at 140C = 5.735mV
@@ -3920,7 +4219,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)5.735e-3), (double)140.0); // TC_TypeK at 140C = 5.735mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)5.735e-3, /* expect: */ (double)140.0); // TC_TypeK at 140C = 5.735mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)5.735e-3, /* expect: */ (double)140.0); // TC_TypeK at 140C = 5.735mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(6.138e-3) expect 150.0 within 0.1 // TC_TypeK at 150C = 6.138mV
@@ -3936,7 +4235,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)6.138e-3), (double)150.0); // TC_TypeK at 150C = 6.138mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)6.138e-3, /* expect: */ (double)150.0); // TC_TypeK at 150C = 6.138mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)6.138e-3, /* expect: */ (double)150.0); // TC_TypeK at 150C = 6.138mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(6.540e-3) expect 160.0 within 0.1 // TC_TypeK at 160C = 6.540mV
@@ -3952,7 +4251,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)6.540e-3), (double)160.0); // TC_TypeK at 160C = 6.540mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)6.540e-3, /* expect: */ (double)160.0); // TC_TypeK at 160C = 6.540mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)6.540e-3, /* expect: */ (double)160.0); // TC_TypeK at 160C = 6.540mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(6.941e-3) expect 170.0 within 0.1 // TC_TypeK at 170C = 6.941mV
@@ -3968,7 +4267,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)6.941e-3), (double)170.0); // TC_TypeK at 170C = 6.941mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)6.941e-3, /* expect: */ (double)170.0); // TC_TypeK at 170C = 6.941mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)6.941e-3, /* expect: */ (double)170.0); // TC_TypeK at 170C = 6.941mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(7.340e-3) expect 180.0 within 0.1 // TC_TypeK at 180C = 7.340mV
@@ -3984,7 +4283,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)7.340e-3), (double)180.0); // TC_TypeK at 180C = 7.340mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)7.340e-3, /* expect: */ (double)180.0); // TC_TypeK at 180C = 7.340mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)7.340e-3, /* expect: */ (double)180.0); // TC_TypeK at 180C = 7.340mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_1 TemperatureOfTC_TypeK(7.739e-3) expect 190.0 within 0.1 // TC_TypeK at 190C = 7.739mV
@@ -4000,7 +4299,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)7.739e-3), (double)190.0); // TC_TypeK at 190C = 7.739mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)7.739e-3, /* expect: */ (double)190.0); // TC_TypeK at 190C = 7.739mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)7.739e-3, /* expect: */ (double)190.0); // TC_TypeK at 190C = 7.739mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(8.138e-3) expect 200.0 within 0.1 // TC_TypeK at 200C = 8.138mV
@@ -4016,7 +4315,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)8.138e-3), (double)200.0); // TC_TypeK at 200C = 8.138mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)8.138e-3, /* expect: */ (double)200.0); // TC_TypeK at 200C = 8.138mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)8.138e-3, /* expect: */ (double)200.0); // TC_TypeK at 200C = 8.138mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(8.539e-3) expect 210.0 within 0.1 // TC_TypeK at 210C = 8.539mV
@@ -4032,7 +4331,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)8.539e-3), (double)210.0); // TC_TypeK at 210C = 8.539mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)8.539e-3, /* expect: */ (double)210.0); // TC_TypeK at 210C = 8.539mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)8.539e-3, /* expect: */ (double)210.0); // TC_TypeK at 210C = 8.539mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(8.940e-3) expect 220.0 within 0.1 // TC_TypeK at 220C = 8.940mV
@@ -4048,7 +4347,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)8.940e-3), (double)220.0); // TC_TypeK at 220C = 8.940mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)8.940e-3, /* expect: */ (double)220.0); // TC_TypeK at 220C = 8.940mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)8.940e-3, /* expect: */ (double)220.0); // TC_TypeK at 220C = 8.940mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_2 TemperatureOfTC_TypeK(9.343e-3) expect 230.0 within 0.1 // TC_TypeK at 230C = 9.343mV
@@ -4064,7 +4363,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)9.343e-3), (double)230.0); // TC_TypeK at 230C = 9.343mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)9.343e-3, /* expect: */ (double)230.0); // TC_TypeK at 230C = 9.343mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)9.343e-3, /* expect: */ (double)230.0); // TC_TypeK at 230C = 9.343mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(9.747e-3) expect 240.0 within 0.1 // TC_TypeK at 240C = 9.747mV
@@ -4080,7 +4379,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)9.747e-3), (double)240.0); // TC_TypeK at 240C = 9.747mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)9.747e-3, /* expect: */ (double)240.0); // TC_TypeK at 240C = 9.747mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)9.747e-3, /* expect: */ (double)240.0); // TC_TypeK at 240C = 9.747mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(10.153e-3) expect 250.0 within 0.1 // TC_TypeK at 250C = 10.153mV
@@ -4096,7 +4395,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)10.153e-3), (double)250.0); // TC_TypeK at 250C = 10.153mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)10.153e-3, /* expect: */ (double)250.0); // TC_TypeK at 250C = 10.153mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)10.153e-3, /* expect: */ (double)250.0); // TC_TypeK at 250C = 10.153mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(10.561e-3) expect 260.0 within 0.1 // TC_TypeK at 260C = 10.561mV
@@ -4112,7 +4411,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)10.561e-3), (double)260.0); // TC_TypeK at 260C = 10.561mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)10.561e-3, /* expect: */ (double)260.0); // TC_TypeK at 260C = 10.561mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)10.561e-3, /* expect: */ (double)260.0); // TC_TypeK at 260C = 10.561mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(10.971e-3) expect 270.0 within 0.1 // TC_TypeK at 270C = 10.971mV
@@ -4128,7 +4427,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)10.971e-3), (double)270.0); // TC_TypeK at 270C = 10.971mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)10.971e-3, /* expect: */ (double)270.0); // TC_TypeK at 270C = 10.971mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)10.971e-3, /* expect: */ (double)270.0); // TC_TypeK at 270C = 10.971mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(11.382e-3) expect 280.0 within 0.1 // TC_TypeK at 280C = 11.382mV
@@ -4144,7 +4443,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)11.382e-3), (double)280.0); // TC_TypeK at 280C = 11.382mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)11.382e-3, /* expect: */ (double)280.0); // TC_TypeK at 280C = 11.382mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)11.382e-3, /* expect: */ (double)280.0); // TC_TypeK at 280C = 11.382mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_2 TemperatureOfTC_TypeK(11.795e-3) expect 290.0 within 0.1 // TC_TypeK at 290C = 11.795mV
@@ -4160,7 +4459,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)11.795e-3), (double)290.0); // TC_TypeK at 290C = 11.795mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)11.795e-3, /* expect: */ (double)290.0); // TC_TypeK at 290C = 11.795mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)11.795e-3, /* expect: */ (double)290.0); // TC_TypeK at 290C = 11.795mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_1 TemperatureOfTC_TypeK(12.209e-3) expect 300.0 within 0.1 // TC_TypeK at 300C = 12.209mV
@@ -4176,7 +4475,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)12.209e-3), (double)300.0); // TC_TypeK at 300C = 12.209mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)12.209e-3, /* expect: */ (double)300.0); // TC_TypeK at 300C = 12.209mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)12.209e-3, /* expect: */ (double)300.0); // TC_TypeK at 300C = 12.209mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_2 TemperatureOfTC_TypeK(14.293e-3) expect 350.0 within 0.1 // TC_TypeK at 350C = 14.293mV
@@ -4192,7 +4491,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)14.293e-3), (double)350.0); // TC_TypeK at 350C = 14.293mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)14.293e-3, /* expect: */ (double)350.0); // TC_TypeK at 350C = 14.293mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)14.293e-3, /* expect: */ (double)350.0); // TC_TypeK at 350C = 14.293mV
#endif // MAX11410_SELFTEST_TC_2 // group TC_2
// @test group TC_1 TemperatureOfTC_TypeK(16.397e-3) expect 400.0 within 0.1 // TC_TypeK at 400C = 16.397mV
@@ -4208,7 +4507,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)16.397e-3), (double)400.0); // TC_TypeK at 400C = 16.397mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)16.397e-3, /* expect: */ (double)400.0); // TC_TypeK at 400C = 16.397mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)16.397e-3, /* expect: */ (double)400.0); // TC_TypeK at 400C = 16.397mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(18.516e-3) expect 450.0 within 0.1 // TC_TypeK at 450C = 18.516mV
@@ -4224,7 +4523,7 @@
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)18.516e-3), (double)450.0); // TC_TypeK at 450C = 18.516mV
tinyTester.err_threshold = 0.1; // within 0.1
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)18.516e-3, /* expect: */ (double)450.0); // TC_TypeK at 450C = 18.516mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)18.516e-3, /* expect: */ (double)450.0); // TC_TypeK at 450C = 18.516mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 TemperatureOfTC_TypeK(20.218e-3) expect 490.0 // TC_TypeK at 490C = 20.218mV
@@ -4238,7 +4537,7 @@
#if MAX11410_SELFTEST_TC_1 // group TC_1 TemperatureOfTC_TypeK TC_TypeK at 490C = 20.218mV
// call-function
// ASSERT_EQ(g_MAX11410_device.TemperatureOfTC_TypeK((double)20.218e-3), (double)490.0); // TC_TypeK at 490C = 20.218mV
- tinyTester.FunctionCall_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)20.218e-3, /* expect: */ (double)490.0); // TC_TypeK at 490C = 20.218mV
+ tinyTester.FunctionCall_f_f_Expect("MAX11410.TemperatureOfTC_TypeK", fn_MAX11410_TemperatureOfTC_TypeK, (double)20.218e-3, /* expect: */ (double)490.0); // TC_TypeK at 490C = 20.218mV
#endif // MAX11410_SELFTEST_TC_1 // group TC_1
// @test group TC_1 tinyTester.blink_time_msec = 75 // default 75 resume hardware self test
@@ -4301,27 +4600,42 @@
// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'MAX11410::MAX11410_CMD_enum_t commandByte, uint32_t regData'
// selfTestFunctionClosures[functionName]['returnType'] = 'uint8_t'
// selfTestFunctionClosures[functionName]['argNames'] = 'commandByte, regData'
-// CommandParamIn_declaration = 'int commandByte, int regData'
+// CommandParamIn_declaration = 'int commandByte, uint32_t regData'
// argNames_recast_implementation = '(MAX11410::MAX11410_CMD_enum_t)commandByte, (uint32_t)regData'
//--------------------------------------------------
// selftest: define function under test
// uint8_t MAX11410::RegWrite(MAX11410::MAX11410_CMD_enum_t commandByte, uint32_t regData)
-uint8_t fn_MAX11410_RegWrite(int commandByte, int regData)
+uint8_t fn_MAX11410_RegWrite(int commandByte, uint32_t regData)
{
return g_MAX11410_device.RegWrite((MAX11410::MAX11410_CMD_enum_t)commandByte, (uint32_t)regData);
}
//--------------------------------------------------
+// selfTestFunctionClosures[functionName]['functionName'] = 'Measure_Voltage'
+// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'MAX11410::MAX11410_AINP_SEL_enum_t ainp, MAX11410::MAX11410_AINN_SEL_enum_t ainn'
+// selfTestFunctionClosures[functionName]['returnType'] = 'double'
+// selfTestFunctionClosures[functionName]['argNames'] = 'ainp, ainn'
+// CommandParamIn_declaration = 'int ainp, int ainn'
+// argNames_recast_implementation = '(MAX11410::MAX11410_AINP_SEL_enum_t)ainp, (MAX11410::MAX11410_AINN_SEL_enum_t)ainn'
+//--------------------------------------------------
+// selftest: define function under test
+// double MAX11410::Measure_Voltage(MAX11410::MAX11410_AINP_SEL_enum_t ainp, MAX11410::MAX11410_AINN_SEL_enum_t ainn)
+double fn_MAX11410_Measure_Voltage(int ainp, int ainn)
+{
+ return g_MAX11410_device.Measure_Voltage((MAX11410::MAX11410_AINP_SEL_enum_t)ainp, (MAX11410::MAX11410_AINN_SEL_enum_t)ainn);
+}
+
+//--------------------------------------------------
// selfTestFunctionClosures[functionName]['functionName'] = 'Configure_CTRL_REF'
// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'uint8_t ref_sel'
// selfTestFunctionClosures[functionName]['returnType'] = 'uint8_t'
// selfTestFunctionClosures[functionName]['argNames'] = 'ref_sel'
-// CommandParamIn_declaration = 'int ref_sel'
+// CommandParamIn_declaration = 'uint8_t ref_sel'
// argNames_recast_implementation = '(uint8_t)ref_sel'
//--------------------------------------------------
// selftest: define function under test
// uint8_t MAX11410::Configure_CTRL_REF(uint8_t ref_sel)
-uint8_t fn_MAX11410_Configure_CTRL_REF(int ref_sel)
+uint8_t fn_MAX11410_Configure_CTRL_REF(uint8_t ref_sel)
{
return g_MAX11410_device.Configure_CTRL_REF((uint8_t)ref_sel);
}
@@ -4331,12 +4645,12 @@
// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'uint8_t sigpath, uint8_t gain'
// selfTestFunctionClosures[functionName]['returnType'] = 'uint8_t'
// selfTestFunctionClosures[functionName]['argNames'] = 'sigpath, gain'
-// CommandParamIn_declaration = 'int sigpath, int gain'
+// CommandParamIn_declaration = 'uint8_t sigpath, uint8_t gain'
// argNames_recast_implementation = '(uint8_t)sigpath, (uint8_t)gain'
//--------------------------------------------------
// selftest: define function under test
// uint8_t MAX11410::Configure_PGA(uint8_t sigpath, uint8_t gain)
-uint8_t fn_MAX11410_Configure_PGA(int sigpath, int gain)
+uint8_t fn_MAX11410_Configure_PGA(uint8_t sigpath, uint8_t gain)
{
return g_MAX11410_device.Configure_PGA((uint8_t)sigpath, (uint8_t)gain);
}
@@ -4346,12 +4660,12 @@
// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'uint32_t value_u24'
// selfTestFunctionClosures[functionName]['returnType'] = 'double'
// selfTestFunctionClosures[functionName]['argNames'] = 'value_u24'
-// CommandParamIn_declaration = 'int value_u24'
+// CommandParamIn_declaration = 'uint32_t value_u24'
// argNames_recast_implementation = '(uint32_t)value_u24'
//--------------------------------------------------
// selftest: define function under test
// double MAX11410::VoltageOfCode_Unipolar(uint32_t value_u24)
-double fn_MAX11410_VoltageOfCode_Unipolar(int value_u24)
+double fn_MAX11410_VoltageOfCode_Unipolar(uint32_t value_u24)
{
return g_MAX11410_device.VoltageOfCode_Unipolar((uint32_t)value_u24);
}
@@ -4361,12 +4675,12 @@
// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'uint32_t value_u24'
// selfTestFunctionClosures[functionName]['returnType'] = 'double'
// selfTestFunctionClosures[functionName]['argNames'] = 'value_u24'
-// CommandParamIn_declaration = 'int value_u24'
+// CommandParamIn_declaration = 'uint32_t value_u24'
// argNames_recast_implementation = '(uint32_t)value_u24'
//--------------------------------------------------
// selftest: define function under test
// double MAX11410::VoltageOfCode_Bipolar_OffsetBinary(uint32_t value_u24)
-double fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary(int value_u24)
+double fn_MAX11410_VoltageOfCode_Bipolar_OffsetBinary(uint32_t value_u24)
{
return g_MAX11410_device.VoltageOfCode_Bipolar_OffsetBinary((uint32_t)value_u24);
}
@@ -4376,74 +4690,74 @@
// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'uint32_t value_u24'
// selfTestFunctionClosures[functionName]['returnType'] = 'double'
// selfTestFunctionClosures[functionName]['argNames'] = 'value_u24'
-// CommandParamIn_declaration = 'int value_u24'
+// CommandParamIn_declaration = 'uint32_t value_u24'
// argNames_recast_implementation = '(uint32_t)value_u24'
//--------------------------------------------------
// selftest: define function under test
// double MAX11410::VoltageOfCode_Bipolar_2sComplement(uint32_t value_u24)
-double fn_MAX11410_VoltageOfCode_Bipolar_2sComplement(int value_u24)
+double fn_MAX11410_VoltageOfCode_Bipolar_2sComplement(uint32_t value_u24)
{
return g_MAX11410_device.VoltageOfCode_Bipolar_2sComplement((uint32_t)value_u24);
}
//--------------------------------------------------
// selfTestFunctionClosures[functionName]['functionName'] = 'TemperatureOfRTD_PT1000'
-// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double rtd_resistance'
+// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double rtd_ohm'
// selfTestFunctionClosures[functionName]['returnType'] = 'double'
-// selfTestFunctionClosures[functionName]['argNames'] = 'rtd_resistance'
-// CommandParamIn_declaration = 'double rtd_resistance'
-// argNames_recast_implementation = '(double)rtd_resistance'
+// selfTestFunctionClosures[functionName]['argNames'] = 'rtd_ohm'
+// CommandParamIn_declaration = 'double rtd_ohm'
+// argNames_recast_implementation = '(double)rtd_ohm'
//--------------------------------------------------
// selftest: define function under test
-// double MAX11410::TemperatureOfRTD_PT1000(double rtd_resistance)
-double fn_MAX11410_TemperatureOfRTD_PT1000(double rtd_resistance)
+// double MAX11410::TemperatureOfRTD_PT1000(double rtd_ohm)
+double fn_MAX11410_TemperatureOfRTD_PT1000(double rtd_ohm)
{
- return g_MAX11410_device.TemperatureOfRTD_PT1000((double)rtd_resistance);
+ return g_MAX11410_device.TemperatureOfRTD_PT1000((double)rtd_ohm);
}
//--------------------------------------------------
// selfTestFunctionClosures[functionName]['functionName'] = 'TemperatureOfRTD_PT100'
-// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double rtd_resistance'
+// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double rtd_ohm'
// selfTestFunctionClosures[functionName]['returnType'] = 'double'
-// selfTestFunctionClosures[functionName]['argNames'] = 'rtd_resistance'
-// CommandParamIn_declaration = 'double rtd_resistance'
-// argNames_recast_implementation = '(double)rtd_resistance'
+// selfTestFunctionClosures[functionName]['argNames'] = 'rtd_ohm'
+// CommandParamIn_declaration = 'double rtd_ohm'
+// argNames_recast_implementation = '(double)rtd_ohm'
//--------------------------------------------------
// selftest: define function under test
-// double MAX11410::TemperatureOfRTD_PT100(double rtd_resistance)
-double fn_MAX11410_TemperatureOfRTD_PT100(double rtd_resistance)
+// double MAX11410::TemperatureOfRTD_PT100(double rtd_ohm)
+double fn_MAX11410_TemperatureOfRTD_PT100(double rtd_ohm)
{
- return g_MAX11410_device.TemperatureOfRTD_PT100((double)rtd_resistance);
+ return g_MAX11410_device.TemperatureOfRTD_PT100((double)rtd_ohm);
}
//--------------------------------------------------
// selfTestFunctionClosures[functionName]['functionName'] = 'TemperatureOfRTD'
-// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double rtd_resistance'
+// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double rtd_ohm'
// selfTestFunctionClosures[functionName]['returnType'] = 'double'
-// selfTestFunctionClosures[functionName]['argNames'] = 'rtd_resistance'
-// CommandParamIn_declaration = 'double rtd_resistance'
-// argNames_recast_implementation = '(double)rtd_resistance'
+// selfTestFunctionClosures[functionName]['argNames'] = 'rtd_ohm'
+// CommandParamIn_declaration = 'double rtd_ohm'
+// argNames_recast_implementation = '(double)rtd_ohm'
//--------------------------------------------------
// selftest: define function under test
-// double MAX11410::TemperatureOfRTD(double rtd_resistance)
-double fn_MAX11410_TemperatureOfRTD(double rtd_resistance)
+// double MAX11410::TemperatureOfRTD(double rtd_ohm)
+double fn_MAX11410_TemperatureOfRTD(double rtd_ohm)
{
- return g_MAX11410_device.TemperatureOfRTD((double)rtd_resistance);
+ return g_MAX11410_device.TemperatureOfRTD((double)rtd_ohm);
}
//--------------------------------------------------
// selfTestFunctionClosures[functionName]['functionName'] = 'TemperatureOfTC_TypeK'
-// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double tc_voltage'
+// selfTestFunctionClosures[functionName]['argListDeclaration'] = 'double tc_v'
// selfTestFunctionClosures[functionName]['returnType'] = 'double'
-// selfTestFunctionClosures[functionName]['argNames'] = 'tc_voltage'
-// CommandParamIn_declaration = 'double tc_voltage'
-// argNames_recast_implementation = '(double)tc_voltage'
+// selfTestFunctionClosures[functionName]['argNames'] = 'tc_v'
+// CommandParamIn_declaration = 'double tc_v'
+// argNames_recast_implementation = '(double)tc_v'
//--------------------------------------------------
// selftest: define function under test
-// double MAX11410::TemperatureOfTC_TypeK(double tc_voltage)
-double fn_MAX11410_TemperatureOfTC_TypeK(double tc_voltage)
+// double MAX11410::TemperatureOfTC_TypeK(double tc_v)
+double fn_MAX11410_TemperatureOfTC_TypeK(double tc_v)
{
- return g_MAX11410_device.TemperatureOfTC_TypeK((double)tc_voltage);
+ return g_MAX11410_device.TemperatureOfTC_TypeK((double)tc_v);
}
@@ -4917,12 +5231,12 @@
// %SD -- SPI diagnostic messages enable
if (g_MAX11410_device.onSPIprint) {
g_MAX11410_device.onSPIprint = NULL;
- g_MAX11410_device.futility_countdown_limit = 3000; // Platform_futility_countdown_limit_fast
+ g_MAX11410_device.loop_limit = 3000; // Platform_futility_countdown_limit_fast
}
else {
void onSPIprint_handler(size_t byteCount, uint8_t mosiData[], uint8_t misoData[]);
g_MAX11410_device.onSPIprint = onSPIprint_handler;
- g_MAX11410_device.futility_countdown_limit = 30; // Platform_futility_countdown_limit_diagnostic
+ g_MAX11410_device.loop_limit = 30; // Platform_futility_countdown_limit_diagnostic
}
break;
case 'W': case 'R': case 'w': case 'r':