Diff: mbed-dev/targets/TARGET_ONSEMI/TARGET_NCS36510/test_map.h

Revision:

18:6a4db94011d3

--- /dev/null	Thu Jan 01 00:00:00 1970 +0000
+++ b/mbed-dev/targets/TARGET_ONSEMI/TARGET_NCS36510/test_map.h	Sun May 14 23:18:57 2017 +0000
@@ -0,0 +1,125 @@
+/**
+******************************************************************************
+* @file test_map.h
+* @brief Test hw module register map
+* @internal
+* @author  ON Semiconductor
+* $Rev: 2848 $
+* $Date: 2014-04-01 22:48:18 +0530 (Tue, 01 Apr 2014) $
+******************************************************************************
+ * Copyright 2016 Semiconductor Components Industries LLC (d/b/a “ON Semiconductor”).
+ * All rights reserved.  This software and/or documentation is licensed by ON Semiconductor
+ * under limited terms and conditions.  The terms and conditions pertaining to the software
+ * and/or documentation are available at http://www.onsemi.com/site/pdf/ONSEMI_T&C.pdf
+ * (“ON Semiconductor Standard Terms and Conditions of Sale, Section 8 Software”) and
+ * if applicable the software license agreement.  Do not use this software and/or
+ * documentation unless you have carefully read and you agree to the limited terms and
+ * conditions.  By using this software and/or documentation, you agree to the limited
+ * terms and conditions.
+*
+* THIS SOFTWARE IS PROVIDED "AS IS".  NO WARRANTIES, WHETHER EXPRESS, IMPLIED
+* OR STATUTORY, INCLUDING, BUT NOT LIMITED TO, IMPLIED WARRANTIES OF
+* MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE APPLY TO THIS SOFTWARE.
+* ON SEMICONDUCTOR SHALL NOT, IN ANY CIRCUMSTANCES, BE LIABLE FOR SPECIAL,
+* INCIDENTAL, OR CONSEQUENTIAL DAMAGES, FOR ANY REASON WHATSOEVER.
+* @endinternal
+*
+* @ingroup test
+*
+* @details
+*/
+
+#ifndef TEST_MAP_H_
+#define TEST_MAP_H_
+
+/*************************************************************************************************
+*                                                                                                *
+*  Header files                                                                                  *
+*                                                                                                *
+*************************************************************************************************/
+
+#include "architecture.h"
+
+/**************************************************************************************************
+*                                                                                                 *
+*  Type definitions                                                                               *
+*                                                                                                 *
+**************************************************************************************************/
+
+/** General test registers
+ *
+ */
+typedef struct {
+    __IO uint32_t UNLOCK;
+    __IO uint32_t ANA_TEST_MUX;
+    __IO uint32_t OVD_ENA_MODE;
+    __IO uint32_t OVD_VAL;
+    __IO uint32_t ANA_TEST_MODE;
+    __IO uint32_t CLK_TEST_MODE;
+    union {
+        struct {
+            __IO uint32_t PAD0:1;
+            __IO uint32_t PAD1:1;
+            __IO uint32_t FORCE_SOURCE:1;
+            __IO uint32_t FORCE_SINK:1;
+            __IO uint32_t PD_CONTROL:3;
+            __IO uint32_t PAD3:1;
+            __IO uint32_t BYPASS_PLL_REG:1;
+            __IO uint32_t PAD4:4;
+            __IO uint32_t DITHER_MODE:1;
+            __IO uint32_t PLL_MODE:1;
+            __IO uint32_t FORCE_LOCK:1;
+        } BITS;
+        __IO uint32_t WORD;
+    } PLL_TEST_MODE;
+    __IO uint32_t RX_TEST_MODE;
+    __IO uint32_t PMU_TEST_MODE;
+} TestReg_t, *TestReg_pt;
+
+/** Digital test registers
+ *
+ */
+typedef struct {
+    union {
+        struct {
+            __IO uint32_t PAD0 :4; /**<   */
+            __IO uint32_t DIO4 :4; /**< DIO4 Test Mux Control */
+            __IO uint32_t DIO5 :4; /**< DIO5 Test Mux Control */
+            __IO uint32_t DIO6 :4; /**< DIO6 Test Mux Control */
+            __IO uint32_t DIO7 :4; /**< DIO7 Test Mux Control */
+            __IO uint32_t DIO8 :4; /**< DIO8 Test Mux Control */
+            __IO uint32_t DIO9 :4; /**< DIO9 Test Mux Control */
+            __IO uint32_t DIO10 :4; /**< DIO10 Test Mux Control */
+        } BITS;
+        __IO uint32_t WORD;
+    } DIG_TEST_MUX;
+    __IO uint32_t DIG_TEST_MODE;
+    union {
+        struct {
+            __IO uint32_t PAD0 :12; /**<   */
+            __IO uint32_t DIO5 :3; /**< DIO5 Input Test Mux Control */
+            __IO uint32_t DIO6 :3; /**< DIO6 Input Test Mux Control */
+            __IO uint32_t DIO7 :3; /**< DIO7 Input Test Mux Control */
+            __IO uint32_t DIO8 :3; /**< DIO8 Input Test Mux Control */
+            __IO uint32_t DIO9 :3; /**< DIO9 Input Test Mux Control */
+            __IO uint32_t DIO10 :3; /**< DIO10 Input Test Mux Control */
+        } BITS;
+        __IO uint32_t WORD;
+    } DIG_IN_TEST_MUX;
+    __IO uint32_t SCAN_MODE;
+    __IO uint32_t BIST_TEST_MUX;
+    __IO uint32_t RAM_DIAG_ADDR;
+    __IO uint32_t RAM_DIAG_DATA;
+    __IO uint32_t SRAMA_DIAG_COMP;
+    __IO uint32_t SRAMB_DIAG_COMP;
+    __IO uint32_t RAM_BUF_TEST_MODE;
+} TestDigReg_t, *TestDigReg_pt;
+
+/** NVM test registers
+ *
+ */
+typedef struct {
+    __O uint32_t PAD;
+} TestNvmReg_t, *TestNvmReg_pt;
+
+#endif /* TEST_MAP_H_ */