As written for first EVE battery test
Dependencies: SDFileSystem mbed
Revision 5:f5ac3e216653, committed 2017-09-20
- Comitter:
- JoeMiller
- Date:
- Wed Sep 20 23:18:03 2017 +0000
- Parent:
- 4:0d79ec30dd60
- Commit message:
- Version 2 ; 1) can now withstand a power line loss and resume properly when restored.; 2) now uses a calibration file on the SD card for storing coefficients.; Macro statements are no longer used. ; 3) The program will enter calib
Changed in this revision
main.cpp | Show annotated file Show diff for this revision Revisions of this file |
diff -r 0d79ec30dd60 -r f5ac3e216653 main.cpp --- a/main.cpp Wed Sep 20 23:13:47 2017 +0000 +++ b/main.cpp Wed Sep 20 23:18:03 2017 +0000 @@ -3,9 +3,13 @@ Note: The design intent was to calibrate each board rather than designing and assembling precision analog circuits for each shield-board. - This version 2 now uses a calibration file on the SD card for coefficients. - this program will enter calibration mode if this file does not exist and - the write the calibration file when complete. No longer need to compile twice. + Version 2 + 1) can now withstand a power line loss and resume properly when restored. + 2) now uses a calibration file on the SD card for storing coefficients. + Macro statements are no longer used. + 3) The program will enter calibration mode if the calibration file does not + exist and when complete will write the calibration file to the SD card. + No longer need to compile twice (once for cal, a 2nd for discharge test). Calibration ASSUMES the MOSFET gain temperature compensation process included in this code is only good for temperatures near room temperatures. Keep this hardware away from