PNI / Mbed 2 deprecated BatteryCapacityTest_Pulsed

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Dependencies:   SDFileSystem mbed

Files at this revision

API Documentation at this revision

Revision 5:f5ac3e216653, committed 2017-09-20

Comitter:
JoeMiller
Date:
Wed Sep 20 23:18:03 2017 +0000
Parent:
4:0d79ec30dd60
Commit message:
Version 2 ; 1) can now withstand a power line loss and resume properly when restored.; 2) now uses a calibration file on the SD card for storing coefficients.; Macro statements are no longer used. ; 3) The program will enter calib

Changed in this revision

main.cpp Show annotated file Show diff for this revision Revisions of this file 
diff -r 0d79ec30dd60 -r f5ac3e216653 main.cpp
--- a/main.cpp	Wed Sep 20 23:13:47 2017 +0000
+++ b/main.cpp	Wed Sep 20 23:18:03 2017 +0000
@@ -3,9 +3,13 @@
 Note: The design intent was to calibrate each board rather than designing 
     and assembling precision analog circuits for each shield-board.
     
-    This version 2 now uses a calibration file on the SD card for coefficients. 
-    this program will enter calibration mode if this file does not exist and 
-    the write the calibration file when complete. No longer need to compile twice.
+    Version 2 
+    1) can now withstand a power line loss and resume properly when restored.
+    2) now uses a calibration file on the SD card for storing coefficients.
+        Macro statements are no longer used. 
+    3) The program will enter calibration mode if the calibration file does not 
+        exist and when complete will write the calibration file to the SD card. 
+        No longer need to compile twice (once for cal, a 2nd for discharge test).
     
     Calibration ASSUMES the MOSFET gain temperature compensation process included in this 
     code is only good for temperatures near room temperatures. Keep this hardware away from