STM32 EEPROM Testing
Dependencies: mbed
cal.h
00001 #ifndef CAL_H 00002 #define CAL_H 00003 00004 00005 typedef struct { 00006 float uv_zero_mV; // uv adc mV reading at 0 ppb 00007 float uv_cal_mV; // uv adc mV reading at calibration point 00008 float uv_cal_ppb; // uv user ppb value at calibration point 00009 00010 float vis_zero_mV; 00011 float vis_cal_mV; 00012 float vis_cal_ppb; 00013 00014 uint16_t trim_4mA; // 12-bit dac value to use for 4 mA 00015 uint16_t trim_20mA; // 12-bit dac value to use for 20 mA 00016 float ppb_at_20mA; // ppb value equal to 20 mA, zero is assumed at 4 00017 00018 uint16_t padding; // needed to create multiple of 2 bytes 00019 //double mAOffsetValue; //mA Offset Value for simulator project. 00020 uint16_t checksum; 00021 00022 } CALIBRATION_DATA; // compiler makes this a multiple of 2 bytes (half-word) 00023 00024 extern CALIBRATION_DATA g_cal; 00025 00026 void cal_init(); 00027 void cal_save(); 00028 void cal_print(); 00029 void cal_factory(); 00030 void cal_test(); 00031 00032 #endif
Generated on Sat Jul 30 2022 04:25:13 by
1.7.2