Test app driver wrapper. More...
#include <NFCTestShim.h>
Public Member Functions | |
| virtual void | cmd_get_max_ndef ()=0 |
| For an EEPROM, this queries and responds with the flash size, For a Controller, responds with the config macro TEST_NDEF_MSG_MAX. More... | |
Test app driver wrapper.
This is a base class containing shared EEPROM and Controller test data + logic. Variations for the 2 different kinds of driver supported are delegated to derived classes.
Definition at line 35 of file NFCTestShim.h.
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pure virtual |
For an EEPROM, this queries and responds with the flash size, For a Controller, responds with the config macro TEST_NDEF_MSG_MAX.
Implemented in NFCProcessController.
