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Dependencies: MAX44000 PWM_Tone_Library nexpaq_mdk
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main.cpp
00001 #include "test_env.h" 00002 00003 /****************************************************************************** 00004 * This will test an I2C EEPROM connected to mbed by writing a predefined byte at 00005 * address 0 and then reading it back and comparing it with the known byte value a 00006 * number of times. This test was written specifically for reproducing the bug 00007 * reported here: 00008 * 00009 * https://mbed.org/forum/bugs-suggestions/topic/4128/ 00010 * 00011 * Test configuration: 00012 * 00013 * set 'ntests' to the number of iterations 00014 * set 'i2c_speed_hz' to the desired speed of the I2C interface 00015 * set 'i2c_delay_us' to the delay that will be inserted between 'write' and 00016 * 'read' I2C operations (https://mbed.org/users/mbed_official/code/mbed/issues/1 00017 * for more details). '0' disables the delay. 00018 * define I2C_EEPROM_VERBOSE to get verbose output 00019 * 00020 * The test ran with a 24LC256 external EEPROM memory, but any I2C EEPROM memory 00021 * that uses two byte addresses should work. 00022 ******************************************************************************/ 00023 00024 #if defined(TARGET_KL25Z) 00025 I2C i2c(PTC9, PTC8); 00026 00027 #elif defined(TARGET_KL27Z) 00028 I2C i2c(PTD6, PTD7); 00029 00030 #elif defined(TARGET_KL46Z) 00031 I2C i2c(PTC9, PTC8); 00032 00033 #elif defined(TARGET_K64F) 00034 I2C i2c(PTE25, PTE24); 00035 00036 #elif defined(TARGET_K66F) 00037 I2C i2c(PTD9, PTD8); 00038 00039 #elif defined(TARGET_K22F) 00040 I2C i2c(PTE0, PTE1); 00041 00042 #elif defined(TARGET_K20D50M) 00043 I2C i2c(PTB3, PTB2); 00044 00045 #elif defined(TARGET_LPC812) 00046 I2C i2c(P0_10, P0_11); 00047 00048 #elif defined(TARGET_LPC1549) 00049 I2C i2c(P0_23, P0_22); 00050 00051 #elif defined(TARGET_LPC11U68) 00052 I2C i2c(SDA, SCL); 00053 00054 #elif defined(TARGET_DELTA_DFCM_NNN40) 00055 I2C i2c(I2C_SDA0, I2C_SCL0); 00056 00057 #elif defined(TARGET_NUCLEO_F030R8) || \ 00058 defined(TARGET_NUCLEO_F070RB) || \ 00059 defined(TARGET_NUCLEO_F072RB) || \ 00060 defined(TARGET_NUCLEO_F091RC) || \ 00061 defined(TARGET_NUCLEO_F103RB) || \ 00062 defined(TARGET_NUCLEO_F302R8) || \ 00063 defined(TARGET_NUCLEO_F303RE) || \ 00064 defined(TARGET_NUCLEO_F334R8) || \ 00065 defined(TARGET_NUCLEO_F401RE) || \ 00066 defined(TARGET_NUCLEO_F410RB) || \ 00067 defined(TARGET_NUCLEO_F411RE) || \ 00068 defined(TARGET_NUCLEO_L053R8) || \ 00069 defined(TARGET_NUCLEO_L073RZ) || \ 00070 defined(TARGET_NUCLEO_L152RE) || \ 00071 defined(TARGET_FF_ARDUINO) || \ 00072 defined(TARGET_VK_RZ_A1H) 00073 I2C i2c(I2C_SDA, I2C_SCL); 00074 00075 #else 00076 I2C i2c(p28, p27); 00077 #endif 00078 00079 namespace { 00080 const int ntests = 10000; 00081 const int i2c_freq_hz = 400000; 00082 const int i2c_delay_us = 0; 00083 } 00084 00085 int main() { 00086 MBED_HOSTTEST_TIMEOUT(15); 00087 MBED_HOSTTEST_SELECT(default_auto); 00088 MBED_HOSTTEST_DESCRIPTION(I2C EEPROM read write test); 00089 MBED_HOSTTEST_START("MBED_A19"); 00090 00091 const int EEPROM_MEM_ADDR = 0xA0; 00092 const char MARK = 0x66; 00093 int fw = 0; 00094 int fr = 0; 00095 int fc = 0; 00096 int i2c_stat = 0; 00097 bool result = true; 00098 00099 i2c.frequency(i2c_freq_hz); 00100 printf("I2C: I2C Frequency: %d Hz\r\n", i2c_freq_hz); 00101 00102 printf("I2C: Write 0x%2X at address 0x0000 test ... \r\n", MARK); 00103 // Data write 00104 { 00105 char data[] = { 0, 0, MARK }; 00106 if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, sizeof(data))) != 0) { 00107 printf("Unable to write data to EEPROM (i2c_stat = 0x%02X), aborting\r\n", i2c_stat); 00108 notify_completion(false); 00109 return 1; 00110 } 00111 00112 // ACK polling (assumes write will be successful eventually) 00113 while (i2c.write(EEPROM_MEM_ADDR, data, 0) != 0) 00114 ; 00115 } 00116 00117 printf("I2C: Read data from address 0x0000 test ... \r\n"); 00118 // Data read (actual test) 00119 for (int i = 0; i < ntests; i++) { 00120 // Write data to EEPROM memory 00121 { 00122 char data[] = { 0, 0 }; 00123 if ((i2c_stat = i2c.write(EEPROM_MEM_ADDR, data, 2, true)) != 0) { 00124 printf("Test %d failed at write, i2c_stat is 0x%02X\r\n", i, i2c_stat); 00125 fw++; 00126 continue; 00127 } 00128 } 00129 00130 // us delay if specified 00131 if (i2c_delay_us != 0) 00132 wait_us(i2c_delay_us); 00133 00134 // Read data 00135 { 00136 char data[1] = { 0 }; 00137 if ((i2c_stat = i2c.read(EEPROM_MEM_ADDR, data, 1)) != 0) { 00138 printf("Test %d failed at read, i2c_stat is 0x%02X\r\n", i, i2c_stat); 00139 fr++; 00140 continue; 00141 } 00142 00143 if (data[0] != MARK) { 00144 printf("Test %d failed at data match\r\n", i); 00145 fc++; 00146 } 00147 } 00148 } 00149 00150 result = (fw + fr + fc == 0); 00151 printf("EEPROM: Test result ... [%s]\r\n", result ? "OK" : "FAIL"); 00152 00153 if (!result) { 00154 printf("Test Statistics:\r\n"); 00155 printf("\tTotal tests: %d\r\n", ntests); 00156 printf("\tFailed at write: %d\r\n", fw); 00157 printf("\tFailed at read: %d\r\n", fr); 00158 printf("\tData mismatch: %d\r\n", fc); 00159 printf("\tTotal failures: %d\r\n", fw + fr + fc); 00160 } 00161 00162 MBED_HOSTTEST_RESULT(result); 00163 }
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