Generates a test signal on an AnalogOut and monitors a signal on an AnalogIn, plotting the test signal or the actual signal depending on a conditional compile. The wait() and wait_ms() library calls for this board are highly inaccurate so a new function is provided to wait for X number of milliseconds -- which is not very accurate.
Dependencies: LCD_DISCO_F429ZI mbed TS_DISCO_F429ZI mbed-os BSP_DISCO_F429ZI
LaserMon-TEC.h
- Committer:
- Damotclese
- Date:
- 2019-06-17
- Revision:
- 2:cbcf2695a4a1
File content as of revision 2:cbcf2695a4a1:
// ----------------------------------------------------------------------
// LaserMon-TEC.h
//
// Fredric L. Rice, June 2019
//
// ----------------------------------------------------------------------
// ----------------------------------------------------------------------
// Defined constants and MACROs we may use
//
// ----------------------------------------------------------------------
#define TEC_HISTORY_COUNT_MAX 10
// ----------------------------------------------------------------------
// External function prototype that we will export
//
// ----------------------------------------------------------------------
extern void TECInit(void);
extern void TECThread(void);
extern uint16_t TECGetLastTenAverage(void);
// End of file